Influence of orientation on the contrast of high-angle annular dark-field images of silicon

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 1, 2007, Pages

  Klenov, Dmitri O ^a,c   Findlay, Scott D ^b   Allen, Leslie J ^b   Stemmer, Susanne ^a  

^a Santa Barbara   (United States)

^b UNIVERSITY OF MELBOURNE   (Australia)

^c Thermo Fisher Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34447637305     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.014111     Document Type: Article

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