Chapter 11 Atomic-Resolution Aberration-Corrected Transmission Electron Microscopy

Advances in Imaging and Electron Physics

Volumn 153, Issue , 2008, Pages 439-480

  Urban, Knut ^a   Houben, Lothar ^a   Jia, Chun Lin ^a   Lentzen, Markus ^a   Mi, Shao Bo ^a   Thust, Andreas ^a   Tillmann, Karsten ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION CORRECTED TEM; ABERRATION-CORRECTED; ATOMIC DISPLACEMENT; ATOMIC RESOLUTION; CHAPTER 11; DEFOCUS; HIGH-PRECISION MEASUREMENT; SPHERICAL ABERRATIONS;

ABERRATIONS;

EID: 67649392661     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(08)01011-2     Document Type: Chapter

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