Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope

Microscopy and Microanalysis

Volumn 14, Issue 1, 2008, Pages 82-88

  Nellist, P D ^a   Cosgriff, E C ^a   Behan, G ^a   Kirkland, A I ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Aberration correction; Confocal electron microscopy; Optical sectioning; Transfer function

Indexed keywords

EID: 38349137963     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608080057     Document Type: Conference Paper

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