An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images

Ultramicroscopy

Volumn 106, Issue 10, 2006, Pages 933-940

  Croitoru, M D ^a   Van Dyck, D ^a   Van Aert, S ^a   Bals, S ^a   Verbeeck, J ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Multislice simulation; Scanning transmission electron microscopy (STEM); Thermal diffuse scattering

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC WAVE SCATTERING; OPTICAL RESOLVING POWER; PHONONS; SCANNING ELECTRON MICROSCOPY;

MULTISLICE SIMULATION; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); THERMAL DIFFUSE SCATTERING;

THERMAL DIFFUSION;

ANALYTIC METHOD; ARTICLE; ATOM; ATOMIC FORCE MICROSCOPY; CALCULATION; DIFFUSE REFLECTANCE SPECTROSCOPY; IMAGE ANALYSIS; LIGHT SCATTERING; MOLECULAR DYNAMICS; PHONON; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMULATION; THICKNESS;

EID: 33747090599     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.04.006     Document Type: Article

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