Characteristics and effectiveness of a foil lens for correction of spherical aberration in scanning transmission electron microscopy

Journal of Electron Microscopy

Volumn 47, Issue 3, 1998, Pages 185-192

  Hanai, Takaaki ^a   Yoshida, Hidetoshi ^a   Hibino, Michio ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Electron probe; Foil lens; Probe forming lens; Scanning transmission electron microscopy; Spherical aberration correction

Indexed keywords

ABERRATIONS; ASPHERICS; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE ENHANCEMENT; SCANNING ELECTRON MICROSCOPY; SPHERES;

BEAM CONVERGENCE; ELECTRON PROBE; FOIL LENS; MEASUREMENTS OF; PROBE-FORMING LENS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPHERICAL ABERRATION COEFFICIENTS; SPHERICAL ABERRATION CORRECTION; SPHERICAL ABERRATIONS;

PROBES;

EID: 0031752403     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023579     Document Type: Article

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