Bloch wave-based calculation of imaging properties of high-resolution scanning confocal electron microscopy

Ultramicroscopy

Volumn 108, Issue 9, 2008, Pages 981-988

  Mitsuishi, K ^a   Iakoubovskii, K ^a   Takeguchi, M ^a   Shimojo, M ^b   Hashimoto, A ^a   Furuya, K ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b SAITAMA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

3D STEM; Bloch wave method; Confocal electron microscopy; Confocal STEM; Image simulation; Optical sectioning; SCEM

Indexed keywords

ATOMIC PHYSICS; ATOMS; IMAGING SYSTEMS; SCANNING; WAVES;

3D IMAGING; AVERAGE IMAGE; B LOCH WAVES; DEFOCUS; ELEMENT MATRICES; ELSEVIER (CO); HIGH RESOLUTIONS; IMAGING PROPERTIES; SAMPLE THICKNESS;

HIGH RESOLUTION ELECTRON MICROSCOPY;

ARTICLE; CONFOCAL MICROSCOPY; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGING SYSTEM; MATHEMATICAL ANALYSIS; SCANNING ELECTRON MICROSCOPY; THREE DIMENSIONAL IMAGING;

EID: 48149103390     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.04.005     Document Type: Article

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