Effects of tilt on high-resolution ADF-STEM imaging

Ultramicroscopy

Volumn 108, Issue 8, 2008, Pages 718-726

  Maccagnano Zacher, S E ^a   Mkhoyan, K A ^a   Kirkland, E J ^a   Silcox, J ^a  

^a Cornell University   (United States)

Author keywords

Aberration correction; ADF imaging; Si; STEM; Tilt

Indexed keywords

COMPUTER NETWORKS; ELECTRON MICROSCOPES; MICROFLUIDICS; MICROSCOPES; OPTICS; SCANNING;

ANNULAR DARK FIELD IMAGES; HIGH RESOLUTIONS; RING OPERATOR; SCANNING TRANSMISSION ELECTRON MICROSCOPES (STEM);

PHOTOACOUSTIC EFFECT;

ARTICLE; CONTRAST ENHANCEMENT; CRYSTAL STRUCTURE; IMAGE ANALYSIS; IMAGE DISPLAY; IMAGE ENHANCEMENT; IMAGING SYSTEM; OPTICAL RESOLUTION; SCANNING ELECTRON MICROSCOPE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 45449108654     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.11.003     Document Type: Article

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