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Ultramicroscopy

Volumn 90, Issue 2-3, 2002, Pages 71-83

A practical approach for STEM image simulation based on the FFT multislice method

(1) Ishizuka, Kazuo a

a Higashimatsuyama (Japan)

Author keywords

HAADF; Image simulation; Multislice method; STEM; TDS

Indexed keywords

ALGORITHMS; AMORPHOUS MATERIALS; COMPUTER SIMULATION; SCATTERING; THICKNESS MEASUREMENT; WAVE PROPAGATION;

THERMAL DIFFUSE SCATTERING (TDS);

SCANNING ELECTRON MICROSCOPY;

ABSORPTION; ARTICLE; IMAGE INTENSIFIER; INTERMETHOD COMPARISON; MICROSCOPE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; TECHNIQUE;

EID: 0036185594 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(01)00145-0 Document Type: Article

Times cited : (252)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.