SimulaTEM: Multislice simulations for general objects

Ultramicroscopy

Volumn 110, Issue 2, 2010, Pages 95-104

  Gomez Rodriguez A ^a   Beltran del Rio L M ^a   Herrera Becerra, R ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

Electron diffraction; High resolution electron microscopy; Image simulation; Multislice

Indexed keywords

AMORPHOUS SAMPLES; ARBITRARY OBJECTS; HIGH-RESOLUTION MICROGRAPHS; PERIODIC OBJECTS;

CRYSTALS; ELECTRON DIFFRACTION; ELECTRONS; GRAIN BOUNDARIES; HOLOGRAPHIC INTERFEROMETRY;

HIGH RESOLUTION ELECTRON MICROSCOPY;

ARTICLE; ATOM; COMPUTER PROGRAM; COMPUTER SIMULATION; CRYSTAL; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; IMAGE ANALYSIS; NORMAL DISTRIBUTION; OBJECT RELATION;

EID: 72649094167     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.09.010     Document Type: Article

References (24)

1. Cowley J.M., and Moodie A.F. Acta Cryst. 10 (1957) 609-619
2. Kirkland J. Advanced Computing in Electron Microscopy (1998), Plenum Press, New York, London
3. Ishuzuka K. Microsc. Microanal. 10 (2004) 34-40
4. Brigham O. The Fast Fourier Transform and its Applications (1988), Prentice-Hall, Englewood Cliffs, NJ
5. Doyle P.A., and Turner P.S. Acta Cryst. A 24 (1968) 390
6. D.T. Cromer, T.J. Waber, International Tables for X-Ray Crystallography, vol. 4, Kynoch Press, Birmingham, 1974.
7. K. Klier, P.Klier, A. Gómez, R. Herrera, unpublished results.
8. IMSL Library Reference Manual, IMS. Inc., Company, Houston, Texas, 1980.
9. R. Herrera, Un Algoritmo para la Simulación de Imágenes y patrones de difracción de objetos arbitrarios en Microscopía Electrónica de Alta Resolución, Ph.D. Dissertation, C.I.C.E.S.E, Ensenada, México, 1989.
10. Bevington P.R. Data Reduction and Error Analysis for the Physical Sciences (1969), McGraw-Hill, New York
11. Weickenmeier A., and Kohl H. Acta Cryst. A 47 (1991) 590-597
12. Fogiel M. Handbook of Mathematical Formulas, Tables, Functions, Graphs and Transforms (1980), Staff of Research and Education Association, New York
13. M. Pan, P. Rez, J.M. Cowley, in: Proceedings of the 47th Annual Meeting of the Electron Microscopy Society of America, 1989, pp. 478-479.
14. Van Dyck D., and Coene W. Ultramicroscopy 15 (1984) 29-40
15. Saxton W.O. Computer Techniques for Image Processing in Electron Microscopy (1978), Academic Press, New York
16. Spence J.C.H. Experimental High-resolution Electron Microscopy (1988), Oxford University Press, Oxford
17. Cooley J.W., and Tukey J.W. Math. Comput. 19 (1965) 297-301
18. Mackay A.L. Acta Cryst. 15 (1962) 916
19. Naumis G.G., and Aragón J.L. Z. Kristallogr. 218 (2003) 397-420
20. H.R. Drew, R.M. Wing, T. Takano, C. Broka, S. Tanaka, K. Itakura, R.E. Dickerson, Structure of a B-DNA dodecamer: conformation and dynamics, Proc. Natl. Acad. Sci. USA 78 (1981) 2179-2183; Protein Data Bank DOI 10.2210/pdb1bna/pdb.
21. H. Terrones, Private communication.
22. P. Stadelmann. JEMS Java Electron Microscopy Software 〈http://cimewww.epfl.ch/people/stadelmann/jemsWebSite/jems.html〉.
23. J. Ascencio, Simulación de procesos de agregación de nanopartículas y su análisis mediante microscopía electrónica de alta resolución, Tesis, Universidad Autónoma del Estado de México, Toluca, México.
24. 〈http://www.fisica.unam.mx/personales/alfredo〉.