Relativistic effects in elastic scattering of electrons in TEM

Ultramicroscopy

Volumn 109, Issue 2, 2009, Pages 154-160

  Rother, Axel ^a   Scheerschmidt, Kurt ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

Electron diffraction; Electron holography; High resolution TEM

Indexed keywords

ATOMS; BOUNDARY VALUE PROBLEMS; DATA RECORDING; DIFFERENCE EQUATIONS; DIFFRACTION; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON HOLOGRAPHY; ELECTRON SCATTERING; HOLOGRAPHIC INTERFEROMETRY; HOLOGRAPHY; LASER RECORDING; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; SCATTERING; SEMICONDUCTOR QUANTUM DOTS; TRANSMISSION ELECTRON MICROSCOPY;

DARK FIELDS; ELASTIC ELECTRON SCATTERINGS; ELECTROMAGNETIC POTENTIALS; HIGH-RESOLUTION TEM; NUMERICAL CALCULATIONS; NUMERICAL INTEGRATIONS; RELATIVISTIC EFFECTS; RELATIVISTIC ELECTRONS; SCATTERING PROCESSES; SPIN EFFECTS; STANDARD PROCEDURES;

ELECTRONS;

ARTICLE; ELECTROMAGNETIC FIELD; IMAGING SYSTEM; LIGHT SCATTERING; MATHEMATICAL COMPUTING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 57749186453     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.08.008     Document Type: Article

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