Progress and perspectives for atomic-resolution electron microscopy

Ultramicroscopy

Volumn 108, Issue 3, 2008, Pages 159-166

  Smith, David J ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Aberration corrected electron microscopy; On line microscope control; Radiation damage; Stobbs' factor

Indexed keywords

ABERRATIONS; COMPUTER SIMULATION; ELECTRON SCATTERING; IMAGE QUALITY; RADIATION DAMAGE;

ON-LINE MICROSCOPE CONTROL; OPERATING MODES;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; IMAGE ANALYSIS; IMAGING SYSTEM; QUANTITATIVE ANALYSIS; RADIATION INJURY; RADIATION SCATTERING; TRANSMISSION ELECTRON MICROSCOPY;

MICROSCOPY, ELECTRON, TRANSMISSION;

EID: 38349150378     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.08.015     Document Type: Article

References (91)

1. Smith D.J. Rep. Prog. Phys. 60 (1997) 1513
2. Phillipp F. Adv. Solid State Phys. 35 (1996) 257
3. Spence J.C.H. Mater. Sci. Eng. R 26 (1999) 1
4. Wang Z.L. Adv. Maters 15 (2003) 1497
5. Cowley J.M. Diffraction Physics. third revised ed. (1995), North-Holland, Amsterdam
6. Pennycook S.J. Adv. Imaging Electron. Phys. 123 (2002) 173
7. Haider M., Uhlemann S., Schwan E., Rose H., Kabius B., and Urban K. Nature 392 (1998) 768
8. Krivanek O.L., Dellby N., and Lupini A.R. Ultramicroscopy 78 (1999) 1
9. Hanszen K.-H. Adv. Opt. Electron. Microsc. 4 (1971) 1
10. Scherzer O. J. Appl. Phys. 20 (1949) 20
11. Frank J. Optik 38 (1973) 519
12. Saxton W.O. Optik 49 (1977) 51
13. Scherzer O. Optik 2 (1947) 114
14. Smith D.J. Adv. Opt. Electron Microsc. 11 (1988) 1
15. Phillipp F., Höschen R., Osaki, Möbus G., and Rühle M. Ultramicroscopy 56 (1994) 1
16. O'Keefe M.A. Ultramicroscopy 47 (1992) 282
17. Saxton W.O. Ultramicroscopy 55 (1994) 171
18. Coene W., Janssen G., Op de Beeck M., and van Dyck D. Phys. Rev. Lett. 69 (1992) 3743
19. Orchowski A., Rau W.D., and Lichte H. Phys. Rev. Lett. 74 (1995) 399
20. Kawasaki T., Yoshida T., Matsuda T., Osakabe N., Tonomura A., Matsui I., and Kjitazawa K. Appl. Phys. Lett. 76 (2000) 1342
21. Cowley J.M., and Moodie A.F. Proc. Phys. Soc. 70 (1957) 486
22. Iijima S., and O'Keefe M.A. J. Microscopy 17 (1979) 347
23. Dellby N., Krivanek O.L., Nellist P.D., Batson P.E., and Lupini A.R. J. Electron. Microsc. 50 (2001) 177
24. Ruska E. Zeit. f. Phys. 85 (1934) 580
25. Allpress J.G., and Sanders J.V. J. Appl. Cryst. 6 (1969) 165
26. Iijima S. J. Appl. Phys. 42 (1971) 5891
27. Cosslett V.E., Camps R.A., Freeman L.A., Saxton W.O., Smith D.J., Nixon W.C., Ahmed H., Catto C.J.D., Cleaver J.R.A., Ross P., Smith K.C.A., and Timbs A.E. Nature 281 (1970) 49
28. Hirabayashi M., Hiraga K., and Shindo D. Ultramicroscopy 9 (1982) 197
29. K. Yagi, K. Takayanagi, K. Kobayashi, S. Nagakura, in: R.M. Fisher, R. Gronsky, K.H. Westmacott (Eds.), Proceedings of Seventh International Conference on High Voltage Electron Microscopy, Lawrence Berkeley Laboratory, Berkeley, 1983, p. 11.
30. Smith D.J., Barry J.C., Petford A.K., and Wheatley J.C. JEOL News 22E (1985) 2
31. Hutchison J.L., Honda T., and Boyes E.D. JEOL News 24E (1986) 9
32. Bourret A., and Penisson J.M. JEOL News 25E (1987) 2
33. van Dyck D., Lichte H., and van der Mast K.D. Ultramicroscopy 64 (1997) 1
34. Horiuchi S., Matsui Y., Kitami Y., Yokoyama M., Suehara S., Wu X.J., Matsui I., and Katsuta T. Ultramicroscopy 39 (1991) 231
35. Ichinose H., Sawada H., Takano E., and Osaki M. J. Electron. Microsc. 48 (1999) 887
36. O'Keefe M.A., Hetherington C.J.D., Wang Y.C., Nelson E.C., Turner J.H., Kisielowski C., Malm J.-O., Mueller R., Ringnalda J., Pan M., and Thust A. Ultramicroscopy 89 (2001) 215
37. Kisielowski C., Hetherington C.J.D., Wang Y.C., Kilaas R., O'Keefe M.A., and Thust A. Ultramicroscopy 89 (2001) 243
38. Batson P.E., Dellby N., and Krivanek O.L. Nature 418 (2002) 617
39. Nellist P.D., Chisholm M.F., Dellby N., Krivanek O.L., Murfitt M.F., Szilagyi Z.S., Lupini A.R., Borisevich A., Sides W.H., and Pennycook S.J. Science 305 (2004) 1741
40. Smith D.J., Saxton W.O., O'Keefe M.A., Wood G.J., and Stobbs W.M. Ultramicroscopy 11 (1983) 263
41. Tee W.J., Smith K.C.A., and Holburn D.M. J. Phys. E: Sci. Instrum. 12 (1979) 35
42. Erasmus S.J., and Smith K.C.A. J. Microscopy 127 (1982) 185
43. Saxton W.O., Smith D.J., and Erasmus S.J. J. Microsc. 130 (1983) 187
44. de Ruijter W.J. Micron 26 (1995) 247
45. Krivanek O.L., and Mooney P.E. Ultramicroscopy 49 (1993) 95
46. Haider M., Rose H., Uhlemann S., Schwan E., Kabius B., and Urban K. Ultramicroscopy 75 (1998) 53
47. Scherzer O. Z. Phys. 101 (1936) 593
48. Rose H. Ultramicroscopy 56 (1994) 11
49. Crewe A.V. Microsc. Microanal. 10 (2004) 414
50. M. Haider, J. Zach, in: G.W. Bailey, M.H. Ellisman, R.A. Henninger, N. Zaluzec (Eds.), Proceedings of Microscopy and Microanalysis 1995, Jones and Begall, New York, 1995, p. 596.
51. Rose H. Optik 85 (1990) 95
52. Mook H.W., and Kruit P. Ultramicroscopy 81 (2000) 129
53. Walther T., and Stegmann H. Microsc. Microanal. 12 (2006) 498
54. Frietag B., Kujawa S., Mul P.M., Ringnalda J., and Tiemeijer P.C. Ultramicroscopy 102 (2005) 209
55. Thust A., Coene W.M.J., Op de Beeck M., and Van Dyck D. Ultramicroscopy 64 (1996) 211
56. Zandbergen H.W., and Van Dyck D. Microsc. Res. Tech. 49 (2000) 301
57. Jia C.L., and Thust A. Phys. Rev. Lett. 82 (1999) 5052
58. Gabor D. Proc. Roy. Soc. A 197 (1949) 454
59. Lehmann M., and Lichte H. Cryst. Res. Technol. 40 (2005) 149
60. Lichte H., Formanek P., Lenk A., Linck M., Matzeck C., Lehmann M., and Simon P. Annu. Rev. Mater. Res. 37 (2007) 539
61. Haider M., Rose H., Uhlemann S., Kabius B., and Urban K. J. Electron. Microsc. 47 (1998) 395
62. Kabius B., Haider M., Uhlemann S., Schwan E., Urban K., and Rose H. J. Electron. Microsc. 51 (2002) S51
63. Tanaka N., Yamasaki J., Usuda K., and Ikarashi N. J. Electron. Microsc. 52 (2003) 69
64. Jia C.-L., Lentzen M., and Urban K. Microsc. Microanal. 10 (2004) 174
65. Jia C.-L., and Urban K. Science 303 (2004) 2001
66. Tillmann K., Houben L., Thust A., and Urban K. J. Mater. Sci. 41 (2006) 4420
67. Watanabe M., Ackland D.W., Burrows A., Kiely C.J., Williams D.B., Krivanek O.L., Dellby N., Murfitt M.F., and Szilagyi Z. Microsc. Microanal. 12 (2006) 515
68. Varela M., Lupini A.R., van Benthem K., Borisevich A.Y., Chisholm M.F., Shibata N., Abe E., and Pennycook S.J. Annu. Rev. Mater. Res. 35 (2005) 539
69. Batson P.E. Ultramicroscopy 96 (2003) 239
70. Varela M., Lupini A.R., Christen H.M., Borisevich A.Y., Dellby N., Krivanek O.L., Nellist P.D., Oxley M.P., Allen L.J., and Pennycook S.J. Phys. Rev. Lett. 92 (2004) 095502
71. van Benthem K., Lupini A.R., Kim M., Bauk H.S., Doh S., Lee J.-H., Oxley M.P., Findlay S.D., Allen L.J., Luck J.T., and Pennycook S.J. Appl. Phys. Lett. 87 (2005) 034104
72. Blom D.A., Allard L.F., Mishina S., and O'Keefe M.A. Microsc. Microanal. 12 (2006) 483
73. Lichte H. Ultramicroscopy 38 (1991) 13
74. Lentzen M., Jahnen B., Jia C.L., Thust A., Tillman K., and Urban K. Ultramicroscopy 92 (2002) 233
75. D. Geiger, H. Lichte, M. Linck, M. Lehmann, Microsc. Microanal., 2007, in press.
76. Lin J.A., and Cowley J.M. Ultramicroscopy 19 (1986) 31
77. Krivanek O.L., Nellist P.D., Dellby N., Murfitt M.F., and Szilagyi Z. Ultramicroscopy 96 (2003) 229
78. Müller H., Uhlemann S., Hartel P., and Haider M. Microsc. Microanal. 12 (2006) 442
79. Voyles P.M., Grazul J.L., and Muller D.A. Ultramicroscopy 96 (2003) 251
80. Chen J.H., Zandbergen H.W., and van Dyck D. Ultramicroscopy 98 (2004) 81
81. Hÿtch M.J., and Stobbs W.M. Ultramicroscopy 53 (1994) 191
82. Boothroyd C.B. J. Microscopy 190 (1998) 99
83. Du K., von Hochmeister K., and Phillipp F. Ultramicroscopy 107 (2007) 281
84. Boothroyd C.B. Ultramicroscopy 83 (2000) 159
85. Howie A. Ultramicrosopy 98 (2004) 73
86. Boothroyd C.B., and Dunin-Borkowski R.E. Ultramicroscopy 98 (2004) 115
87. Hobbs L.W. In: Chapman J.N., and Craven A.J. (Eds). Quantitative Electron Microscopy (1984), Scottish Universities Summer School in Physics, Edinburgh 399
88. Hofmann D., and Ernst F. Ultramicroscopy 53 (1994) 205
89. Beeching M.J., and Spargo A.E.C. Ultramicroscopy 52 (1993) 243
90. Beeching M.J., and Spargo A.E.C. J. Microscopy 190 (1998) 262
91. Lentzen M., and Urban K. Ultramicroscopy 62 (1996) 89