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Volumn 65, Issue 3-4, 1996, Pages 217-228
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Retrieval of crystal defect structures from HREM images by simulated evolution. II. Experimental image evaluation
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
ELECTRON MICROSCOPY;
ERROR ANALYSIS;
IMAGE ANALYSIS;
IMAGING TECHNIQUES;
INTERFACES (MATERIALS);
OPTIMIZATION;
ITERATIVE IMAGING MATCHING;
SIMULATED EVOLUTION;
CRYSTAL DEFECTS;
ARTICLE;
CRYSTAL STRUCTURE;
ELECTRON MICROSCOPY;
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EID: 0030272105
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(96)00074-5 Document Type: Article |
Times cited : (32)
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References (26)
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