메뉴 건너뛰기




Volumn 113, Issue C, 2000, Pages 147-203

The principles and interpretation of annular dark-field Z-contrast imaging

Author keywords

[No Author keywords available]

Indexed keywords


EID: 77957727901     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(00)80013-0     Document Type: Article
Times cited : (338)

References (87)
  • 1
    • 0017546247 scopus 로고
    • On the incoherent imaging in the scanning transmission electron microscope
    • Ade G. On the incoherent imaging in the scanning transmission electron microscope. Optik 49 (1977) 113-116
    • (1977) Optik , vol.49 , pp. 113-116
    • Ade, G.1
  • 2
    • 0031532402 scopus 로고    scopus 로고
    • Theory of Lattice Resolution in High-angle Annular Dark-field Images
    • Amali A., and Rez P. Theory of Lattice Resolution in High-angle Annular Dark-field Images. Microsc. Microanal. 3 (1997) 28-46
    • (1997) Microsc. Microanal. , vol.3 , pp. 28-46
    • Amali, A.1    Rez, P.2
  • 3
    • 0030875192 scopus 로고    scopus 로고
    • High Angle Annular Dark Field Imaging of Stacking Faults
    • Amali A., Rez P., and Cowley J.M. High Angle Annular Dark Field Imaging of Stacking Faults. Micron 28 (1997) 89-94
    • (1997) Micron , vol.28 , pp. 89-94
    • Amali, A.1    Rez, P.2    Cowley, J.M.3
  • 4
    • 77957748587 scopus 로고    scopus 로고
    • An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging
    • Anderson S.C., Birkeland C.R., Anstis G.R., and Cockayne D.J.H. An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging. Image Restoration and Reconstruction (1997)
    • (1997) Image Restoration and Reconstruction
    • Anderson, S.C.1    Birkeland, C.R.2    Anstis, G.R.3    Cockayne, D.J.H.4
  • 5
    • 80051525217 scopus 로고
    • Theorie der Beugung von Elektronen an Kristallen
    • Bethe H. Theorie der Beugung von Elektronen an Kristallen. Ann. Phys. Lpz. 87 (1928) 55-129
    • (1928) Ann. Phys. Lpz. , vol.87 , pp. 55-129
    • Bethe, H.1
  • 6
    • 0039403752 scopus 로고
    • Spherical aberration and the information content of optical images
    • Black G., and Linfoot E.H. Spherical aberration and the information content of optical images. Proc. R. Soc. (Lond.) A 239 (1957) 522-540
    • (1957) Proc. R. Soc. (Lond.) A , vol.239 , pp. 522-540
    • Black, G.1    Linfoot, E.H.2
  • 8
    • 84944816671 scopus 로고
    • Structure Determination of Planar Defects in Crystals of Germanium and Molybdenum by HREM
    • Bourret A., Rouviere J.L., and Penisson J.M. Structure Determination of Planar Defects in Crystals of Germanium and Molybdenum by HREM. Acta. Cryst. A 44 (1988) 838-847
    • (1988) Acta. Cryst. A , vol.44 , pp. 838-847
    • Bourret, A.1    Rouviere, J.L.2    Penisson, J.M.3
  • 9
    • 0029563828 scopus 로고
    • Atomic-resolution electron energy-loss spectroscopy in the scanning transmission electron microscope
    • Browning N.D., and Pennycook S.J. Atomic-resolution electron energy-loss spectroscopy in the scanning transmission electron microscope. J. Microsc. 180 (1995) 230-237
    • (1995) J. Microsc. , vol.180 , pp. 230-237
    • Browning, N.D.1    Pennycook, S.J.2
  • 12
    • 0001641367 scopus 로고
    • Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy
    • Coene W., Janssen G., Op de Beeck M., and Van Dyck D. Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy. Phys. Rev. Lett. 69 (1992) 3743-3746
    • (1992) Phys. Rev. Lett. , vol.69 , pp. 3743-3746
    • Coene, W.1    Janssen, G.2    Op de Beeck, M.3    Van Dyck, D.4
  • 13
    • 0014538104 scopus 로고
    • Image contrast in a transmission scanning electron microscope
    • Cowley J.M. Image contrast in a transmission scanning electron microscope. Appl. Phys. Lett. 15 (1969) 58-59
    • (1969) Appl. Phys. Lett. , vol.15 , pp. 58-59
    • Cowley, J.M.1
  • 15
    • 0002523962 scopus 로고
    • Electron Diffraction: An Introduction
    • Cowley J.M. (Ed), OUP, Oxford
    • Cowley J.M. Electron Diffraction: An Introduction. In: Cowley J.M. (Ed). Electron Diffraction Techniques Vol. 1 (1992), OUP, Oxford 1-74
    • (1992) Electron Diffraction Techniques , vol.1 , pp. 1-74
    • Cowley, J.M.1
  • 16
    • 0001747776 scopus 로고
    • The scattering of electrons by atoms and crystals I. A new theoretical approach
    • Cowley J.M., and Moodie A.F. The scattering of electrons by atoms and crystals I. A new theoretical approach. Acta Cryst. 10 (1957) 609-619
    • (1957) Acta Cryst. , vol.10 , pp. 609-619
    • Cowley, J.M.1    Moodie, A.F.2
  • 17
    • 77957736095 scopus 로고
    • The physics of the high-resolution STEM
    • Crewe A.V. The physics of the high-resolution STEM. Rep. Prog. Phys. 43 (1980) 631-639
    • (1980) Rep. Prog. Phys. , vol.43 , pp. 631-639
    • Crewe, A.V.1
  • 18
    • 0000363256 scopus 로고
    • A high-resolution scanning transmission electron microscope
    • Crewe A.V., Wall J., and Welter L.M. A high-resolution scanning transmission electron microscope. J. Appl. Phys. 39 (1968) 5861-5868
    • (1968) J. Appl. Phys. , vol.39 , pp. 5861-5868
    • Crewe, A.V.1    Wall, J.2    Welter, L.M.3
  • 20
    • 37049250176 scopus 로고
    • Visibility of single atoms
    • Crewe A.V., Wall J., and Langmore J. Visibility of single atoms. Science 168 (1970) 1338-1340
    • (1970) Science , vol.168 , pp. 1338-1340
    • Crewe, A.V.1    Wall, J.2    Langmore, J.3
  • 21
    • 37049250176 scopus 로고
    • Visibility of single atoms
    • Dinges A.V., Wall J., and Langmore J. Visibility of single atoms. Science 168 (1970) 1338-1340
    • (1970) Science , vol.168 , pp. 1338-1340
    • Dinges, A.V.1    Wall, J.2    Langmore, J.3
  • 22
    • 0029346921 scopus 로고
    • Simulation of TEM images considering phonon and electronic excitations
    • Dinges C., Berger A., and Rose H. Simulation of TEM images considering phonon and electronic excitations. Ultramicroscopy 60 (1995) 49-70
    • (1995) Ultramicroscopy , vol.60 , pp. 49-70
    • Dinges, C.1    Berger, A.2    Rose, H.3
  • 23
    • 0018290233 scopus 로고
    • A study of grain boundary segregation in Cu-Bi alloys using STEM
    • Donald A.M., and Craven A.J. A study of grain boundary segregation in Cu-Bi alloys using STEM. Phil. Mag. A 39 (1979) 1-11
    • (1979) Phil. Mag. A , vol.39 , pp. 1-11
    • Donald, A.M.1    Craven, A.J.2
  • 24
    • 0019636333 scopus 로고
    • Resolution and contrast of crystalline objects in high-resolution scanning transmission electron microscopy
    • Fertig J., and Rose H. Resolution and contrast of crystalline objects in high-resolution scanning transmission electron microscopy. Optik 59 (1981) 407-429
    • (1981) Optik , vol.59 , pp. 407-429
    • Fertig, J.1    Rose, H.2
  • 25
    • 34250769340 scopus 로고
    • A new microscope principle
    • Gabor D. A new microscope principle. Nature 161 (1948) 777-778
    • (1948) Nature , vol.161 , pp. 777-778
    • Gabor, D.1
  • 26
    • 84927988986 scopus 로고
    • Kinematical Theory of Electron Diffraction
    • Amelinckx S., Gevers G., Remaut G., and Van Landuyt J. (Eds), North Holland, Amsterdam
    • Gevers R. Kinematical Theory of Electron Diffraction. In: Amelinckx S., Gevers G., Remaut G., and Van Landuyt J. (Eds). Modern Diffraction and Imaging Techniques in Materials Science (1970), North Holland, Amsterdam 1-33
    • (1970) Modern Diffraction and Imaging Techniques in Materials Science , pp. 1-33
    • Gevers, R.1
  • 27
    • 0024302689 scopus 로고
    • A systematic analysis of HREM imaging of elemental semiconductors
    • Glaisher R.W., Spargo A.E.C., and Smith D.J. A systematic analysis of HREM imaging of elemental semiconductors. Ultramicroscopy 27 (1989) 35-52
    • (1989) Ultramicroscopy , vol.27 , pp. 35-52
    • Glaisher, R.W.1    Spargo, A.E.C.2    Smith, D.J.3
  • 28
    • 33747581732 scopus 로고
    • Image reconstruction from incomplete and noisy data
    • Gull S.F., and Daniell G.J. Image reconstruction from incomplete and noisy data. Nature 272 (1978) 686-690
    • (1978) Nature , vol.272 , pp. 686-690
    • Gull, S.F.1    Daniell, G.J.2
  • 30
    • 0030175197 scopus 로고    scopus 로고
    • Conditions and reasons for incoherent imaging in STEM
    • Hartel P., Rose H., and Dinges C. Conditions and reasons for incoherent imaging in STEM. Ultramicroscopy 63 (1996) 93-114
    • (1996) Ultramicroscopy , vol.63 , pp. 93-114
    • Hartel, P.1    Rose, H.2    Dinges, C.3
  • 31
    • 0027753682 scopus 로고
    • Thickness effects in ADF STEM zone axis images
    • Hillyard S., and Silcox J. Thickness effects in ADF STEM zone axis images. Ultramicroscopy 52 (1993) 325-334
    • (1993) Ultramicroscopy , vol.52 , pp. 325-334
    • Hillyard, S.1    Silcox, J.2
  • 32
    • 0029278184 scopus 로고
    • Detector geometry, thermal diffuse scattering and strain effects in ADF STEM images
    • Hillyard S., and Silcox J. Detector geometry, thermal diffuse scattering and strain effects in ADF STEM images. Ultramicroscopy 58 (1995) 6-17
    • (1995) Ultramicroscopy , vol.58 , pp. 6-17
    • Hillyard, S.1    Silcox, J.2
  • 33
    • 0027545078 scopus 로고
    • Annular dork-field imaging: resolution and thickness effects
    • Hillyard S., Loane R.F., and Silcox J. Annular dork-field imaging: resolution and thickness effects. Ultramicroscopy 49 (1993) 14-25
    • (1993) Ultramicroscopy , vol.49 , pp. 14-25
    • Hillyard, S.1    Loane, R.F.2    Silcox, J.3
  • 34
    • 0001305177 scopus 로고
    • Aperture synthesis with a non-regular distribution of interferometer baselines
    • Högbom J.A. Aperture synthesis with a non-regular distribution of interferometer baselines. Astron. Astrophys. Suppl. 15 (1974) 417-426
    • (1974) Astron. Astrophys. Suppl. , vol.15 , pp. 417-426
    • Högbom, J.A.1
  • 35
    • 0018688356 scopus 로고
    • Image contrast and localized signal selection techniques
    • Howie A. Image contrast and localized signal selection techniques. J. Microsc. 117 (1979) 11-23
    • (1979) J. Microsc. , vol.117 , pp. 11-23
    • Howie, A.1
  • 36
    • 0003961179 scopus 로고
    • Electron Diffraction Theory
    • Cowley J.M. (Ed), OUP, Oxford
    • Humphreys C.J., and Bithell E.G. Electron Diffraction Theory. In: Cowley J.M. (Ed). Electron Diffraction Techniques Vol. 1 (1992), OUP, Oxford 75-151
    • (1992) Electron Diffraction Techniques , vol.1 , pp. 75-151
    • Humphreys, C.J.1    Bithell, E.G.2
  • 37
    • 0033045128 scopus 로고    scopus 로고
    • Practical aspects of atomic resolution imaging and analysis in STEM
    • James E.M., and Browning N.D. Practical aspects of atomic resolution imaging and analysis in STEM. Ultramicroscopy 78 (1999) 125-139
    • (1999) Ultramicroscopy , vol.78 , pp. 125-139
    • James, E.M.1    Browning, N.D.2
  • 38
    • 0027386280 scopus 로고
    • Incoherent imaging of thin specimens using coherently scattered electrons
    • Jesson D.E., and Pennycook S.J. Incoherent imaging of thin specimens using coherently scattered electrons. Proc. R. Soc. (London) A 441 (1993) 261-281
    • (1993) Proc. R. Soc. (London) A , vol.441 , pp. 261-281
    • Jesson, D.E.1    Pennycook, S.J.2
  • 39
    • 84987779462 scopus 로고
    • Incoherent imaging of crystals using thermally scatterec electrons
    • Jesson D.E., and Pennycook S.J. Incoherent imaging of crystals using thermally scatterec electrons. Proc. R. Soc. (London) A 449 (1995) 273-293
    • (1995) Proc. R. Soc. (London) A , vol.449 , pp. 273-293
    • Jesson, D.E.1    Pennycook, S.J.2
  • 40
    • 0023263893 scopus 로고
    • Simulation of annular dark field STEM images using a modified multislice method
    • Kirkland E.J., Loane R.F., and Silcox J. Simulation of annular dark field STEM images using a modified multislice method. Ultramicroscopy 23 (1987) 77-96
    • (1987) Ultramicroscopy , vol.23 , pp. 77-96
    • Kirkland, E.J.1    Loane, R.F.2    Silcox, J.3
  • 41
    • 0022221981 scopus 로고
    • Theory of image formation by inelastically scattered electrons in the electron microscope
    • Kohl H., and Rose H. Theory of image formation by inelastically scattered electrons in the electron microscope. Adv. Elect. & Electron. Phys. 65 (1985) 173-227
    • (1985) Adv. Elect. & Electron. Phys. , vol.65 , pp. 173-227
    • Kohl, H.1    Rose, H.2
  • 43
    • 0002110722 scopus 로고
    • Electron image plane off-axis holography of atomic structures
    • Lichte H. Electron image plane off-axis holography of atomic structures. Adv. in Opt. & Electron Microsc. 12 (1991) 25-91
    • (1991) Adv. in Opt. & Electron Microsc. , vol.12 , pp. 25-91
    • Lichte, H.1
  • 44
    • 84944815925 scopus 로고
    • Visibility of single heavy atoms on thin crystalline silicon in simulated dark-field STEM mages
    • Loane R.F., Kirkland E.J., and Silcox J. Visibility of single heavy atoms on thin crystalline silicon in simulated dark-field STEM mages. Acta Cryst. A 44 (1988) 912-927
    • (1988) Acta Cryst. A , vol.44 , pp. 912-927
    • Loane, R.F.1    Kirkland, E.J.2    Silcox, J.3
  • 45
    • 0001284232 scopus 로고
    • Thermal vibrations in convergent-beam electron diffraction
    • Loane R.F., Xu P., and Silcox J. Thermal vibrations in convergent-beam electron diffraction. Acta Cryst. A 47 (1991) 267-278
    • (1991) Acta Cryst. A , vol.47 , pp. 267-278
    • Loane, R.F.1    Xu, P.2    Silcox, J.3
  • 46
    • 0026816717 scopus 로고
    • Incoherent imaging of zone axis crystals with ADF STEM
    • Loane R.F., Xu P., and Silcox J. Incoherent imaging of zone axis crystals with ADF STEM. Ultramicroscopy 40 (1992) 121-138
    • (1992) Ultramicroscopy , vol.40 , pp. 121-138
    • Loane, R.F.1    Xu, P.2    Silcox, J.3
  • 47
    • 0001195918 scopus 로고
    • On the theory of optical images with special reference to the microscope
    • Lord R. On the theory of optical images with special reference to the microscope. Phil. Mag. 42 5 (1896) 167-195
    • (1896) Phil. Mag. , vol.42 , Issue.5 , pp. 167-195
    • Lord, R.1
  • 49
    • 0029343415 scopus 로고
    • Direct observation of dislocation core structures in CdTe/GaAs(001)
    • McGibbon A.J., Pennycook S.J., and Angelo J.E. Direct observation of dislocation core structures in CdTe/GaAs(001). Science 269 (1995) 519-521
    • (1995) Science , vol.269 , pp. 519-521
    • McGibbon, A.J.1    Pennycook, S.J.2    Angelo, J.E.3
  • 50
    • 0030272104 scopus 로고    scopus 로고
    • Retrieval of crystal defect structures from HREM images by simulated evolution. I. Basic technique
    • Möbus G. Retrieval of crystal defect structures from HREM images by simulated evolution. I. Basic technique. Ultramicroscopy 65 (1996) 205-216
    • (1996) Ultramicroscopy , vol.65 , pp. 205-216
    • Möbus, G.1
  • 51
    • 0030272105 scopus 로고    scopus 로고
    • Retrieval of crystal defect structures from HREM images by simulated evolution. II. Experimental image evaluation
    • Möbus G., and Dehm G. Retrieval of crystal defect structures from HREM images by simulated evolution. II. Experimental image evaluation. Ultramicroscopy 65 (1996) 217-228
    • (1996) Ultramicroscopy , vol.65 , pp. 217-228
    • Möbus, G.1    Dehm, G.2
  • 52
    • 0030979935 scopus 로고    scopus 로고
    • Position dependence of the visibility of a single gold atom in silicon crystals in HAADF-STEM image simulation
    • Nakamura K., Kakibagashi H., Kanehori K., and Tanaka N. Position dependence of the visibility of a single gold atom in silicon crystals in HAADF-STEM image simulation. J. Electron Microsc. 46 (1997) 33-43
    • (1997) J. Electron Microsc. , vol.46 , pp. 33-43
    • Nakamura, K.1    Kakibagashi, H.2    Kanehori, K.3    Tanaka, N.4
  • 53
    • 0029833180 scopus 로고    scopus 로고
    • Direct imaging of the atomic configuration of ultradispersed catalysts
    • Nellist P.D., and Pennycook S.J. Direct imaging of the atomic configuration of ultradispersed catalysts. Science 274 (1996) 413-415
    • (1996) Science , vol.274 , pp. 413-415
    • Nellist, P.D.1    Pennycook, S.J.2
  • 54
    • 0032500983 scopus 로고    scopus 로고
    • Subngstrom resolution by underfocussed incoherent transmission electron microscopy
    • Nellist P.D., and Pennycook S.J. Subngstrom resolution by underfocussed incoherent transmission electron microscopy. Phys. Rev. Lett. 81 (1998) 4156-4159
    • (1998) Phys. Rev. Lett. , vol.81 , pp. 4156-4159
    • Nellist, P.D.1    Pennycook, S.J.2
  • 55
    • 0031945495 scopus 로고    scopus 로고
    • Accurate structure determination from image reconstruction in ADF STEM
    • Nellist P.D., and Pennycook S.J. Accurate structure determination from image reconstruction in ADF STEM. J. Microsc. 190 (1998) 159-170
    • (1998) J. Microsc. , vol.190 , pp. 159-170
    • Nellist, P.D.1    Pennycook, S.J.2
  • 56
    • 0033011329 scopus 로고    scopus 로고
    • Incoherent imaging using dynamically scattered coherent electrons
    • Nellist P.D., and Pennycook S.J. Incoherent imaging using dynamically scattered coherent electrons. Ultramicroscopy 78 (1999) 111-124
    • (1999) Ultramicroscopy , vol.78 , pp. 111-124
    • Nellist, P.D.1    Pennycook, S.J.2
  • 57
    • 0028437070 scopus 로고
    • Beyond the conventional information limit: the relevant coherence function
    • Nellist P.D., and Rodenburg J.M. Beyond the conventional information limit: the relevant coherence function. Ultramicroscopy 54 (1994) 61-74
    • (1994) Ultramicroscopy , vol.54 , pp. 61-74
    • Nellist, P.D.1    Rodenburg, J.M.2
  • 58
    • 0029292692 scopus 로고
    • Resolution beyond the 'information limit' in transmission electron microscopy
    • Nellist P.D., McCallum B.C., and Rodenburg J.M. Resolution beyond the 'information limit' in transmission electron microscopy. Nature 374 (1995) 630-632
    • (1995) Nature , vol.374 , pp. 630-632
    • Nellist, P.D.1    McCallum, B.C.2    Rodenburg, J.M.3
  • 59
    • 0000029136 scopus 로고
    • Electron holography surmounts resolution limit of electron microscopy
    • Orchowski A., Rau W.D., and Lichte H. Electron holography surmounts resolution limit of electron microscopy. Phys. Rev. Lett. 74 (1995) 399-401
    • (1995) Phys. Rev. Lett. , vol.74 , pp. 399-401
    • Orchowski, A.1    Rau, W.D.2    Lichte, H.3
  • 60
    • 0024263925 scopus 로고
    • Chemically sensitive structure-imaging with a scanning transmission electron microscope
    • Pennycook S.J., and Boatner L.A. Chemically sensitive structure-imaging with a scanning transmission electron microscope. Nature 336 (1988) 565-567
    • (1988) Nature , vol.336 , pp. 565-567
    • Pennycook, S.J.1    Boatner, L.A.2
  • 61
    • 11944259078 scopus 로고
    • High-resolution incoherent imaging of crystals
    • Pennycook S.J., and Jesson D.E. High-resolution incoherent imaging of crystals. Phys. Rev. Lett. 64 (1990) 938-941
    • (1990) Phys. Rev. Lett. , vol.64 , pp. 938-941
    • Pennycook, S.J.1    Jesson, D.E.2
  • 62
    • 0026202777 scopus 로고
    • High-resolution Z-contrast imaging of crystals
    • Pennycook S.J., and Jesson D.E. High-resolution Z-contrast imaging of crystals. Ultramicroscopy 37 (1991) 14-38
    • (1991) Ultramicroscopy , vol.37 , pp. 14-38
    • Pennycook, S.J.1    Jesson, D.E.2
  • 63
    • 0027714798 scopus 로고
    • Imaging elastic strain in high-angle annular dark-field scanning transmission electron microscopy
    • Perovic D.D., Rossouw C.J., and Howie A. Imaging elastic strain in high-angle annular dark-field scanning transmission electron microscopy. Ultramicroscopy 52 (1993) 353-359
    • (1993) Ultramicroscopy , vol.52 , pp. 353-359
    • Perovic, D.D.1    Rossouw, C.J.2    Howie, A.3
  • 64
    • 0011183879 scopus 로고
    • The theory of super-resolution electron microscopy via Wigner-distribution deconvolution
    • Rodenburg J.M., and Bates R.H.T. The theory of super-resolution electron microscopy via Wigner-distribution deconvolution. Phil. Trans. R. Soc. (Lond.) A 339 (1992) 521-553
    • (1992) Phil. Trans. R. Soc. (Lond.) A , vol.339 , pp. 521-553
    • Rodenburg, J.M.1    Bates, R.H.T.2
  • 65
    • 0242278253 scopus 로고
    • Über einige Fehler von Elektronenlinsen
    • Scherzer O. Über einige Fehler von Elektronenlinsen. Z. Phys. 101 (1936) 593-603
    • (1936) Z. Phys. , vol.101 , pp. 593-603
    • Scherzer, O.1
  • 66
    • 0002170585 scopus 로고
    • The theoretical resolution limit of the electron microscope
    • Scherzer O. The theoretical resolution limit of the electron microscope. J. Appl. Phys. 20 (1949) 20-29
    • (1949) J. Appl. Phys. , vol.20 , pp. 20-29
    • Scherzer, O.1
  • 67
    • 0023467787 scopus 로고
    • Chromatic aberration effects in small electron probes
    • Shao Z., and Crewe A.V. Chromatic aberration effects in small electron probes. Ultramicroscopy 23 (1987) 169-174
    • (1987) Ultramicroscopy , vol.23 , pp. 169-174
    • Shao, Z.1    Crewe, A.V.2
  • 68
    • 0005839912 scopus 로고
    • Annular dark field electron microscope images with better than 2 resolution at 100 kV
    • Shin D.H., Kirkland E.J., and Silcox J. Annular dark field electron microscope images with better than 2 resolution at 100 kV. Appl. Phys. Lett. 55 (1989) 2456-2458
    • (1989) Appl. Phys. Lett. , vol.55 , pp. 2456-2458
    • Shin, D.H.1    Kirkland, E.J.2    Silcox, J.3
  • 69
    • 0000676356 scopus 로고    scopus 로고
    • Prior distributions on measure space
    • Sibisi S., and Skilling J. Prior distributions on measure space. J. R. Statist. Soc. B 59 (1997) 217-235
    • (1997) J. R. Statist. Soc. B , vol.59 , pp. 217-235
    • Sibisi, S.1    Skilling, J.2
  • 71
    • 0000431384 scopus 로고
    • Maximum entropy image reconstruction: general algorithm
    • Skilling J., and Bryan R.K. Maximum entropy image reconstruction: general algorithm. Mon. Not. R. Astr. Soc. 511 (1984) 111-124
    • (1984) Mon. Not. R. Astr. Soc. , vol.511 , pp. 111-124
    • Skilling, J.1    Bryan, R.K.2
  • 72
    • 0031917020 scopus 로고    scopus 로고
    • Probabilistic data analysis: An introductory guide
    • Skilling J. Probabilistic data analysis: An introductory guide. J. Microsc. 190 (1998) 28-36
    • (1998) J. Microsc. , vol.190 , pp. 28-36
    • Skilling, J.1
  • 73
    • 77957743841 scopus 로고    scopus 로고
    • Image improvement and information retrieval using the CLEAN algorithm
    • Sleight M.E., Midgley P.A., and Vincent R. Image improvement and information retrieval using the CLEAN algorithm. Proc. EUREM-11, Dublin, 1996 2 (1998) 488-489
    • (1998) Proc. EUREM-11, Dublin, 1996 , vol.2 , pp. 488-489
    • Sleight, M.E.1    Midgley, P.A.2    Vincent, R.3
  • 74
    • 0000546080 scopus 로고    scopus 로고
    • The realisation of atomic resolution with the electron microscope
    • Smith D.J. The realisation of atomic resolution with the electron microscope. Rep. Prog. Phys. 60 (1997) 1513-1580
    • (1997) Rep. Prog. Phys. , vol.60 , pp. 1513-1580
    • Smith, D.J.1
  • 76
    • 0017949355 scopus 로고
    • Lattice imaging in STEM
    • Spence J.C.H., and Cowley J.M. Lattice imaging in STEM. Optik 50 (1978) 129-142
    • (1978) Optik , vol.50 , pp. 129-142
    • Spence, J.C.H.1    Cowley, J.M.2
  • 77
    • 0024746653 scopus 로고
    • On the HOLZ contribution to STEM lattice images formed using high-angle dark-field detectors
    • Spence J.C.H., Zuo J.M., and Lynch J. On the HOLZ contribution to STEM lattice images formed using high-angle dark-field detectors. Ultramicroscopy 31 (1989) 233-240
    • (1989) Ultramicroscopy , vol.31 , pp. 233-240
    • Spence, J.C.H.1    Zuo, J.M.2    Lynch, J.3
  • 78
    • 0041086286 scopus 로고
    • An analysis of the properties of CLEAN and smoothness stabilised CLEAN-some warnings
    • Tan S.M. An analysis of the properties of CLEAN and smoothness stabilised CLEAN-some warnings. Mon. Not. R. Astr. Soc. 220 (1986) 971-1001
    • (1986) Mon. Not. R. Astr. Soc. , vol.220 , pp. 971-1001
    • Tan, S.M.1
  • 79
    • 0027670012 scopus 로고
    • Coherence and multiple-scattering in z-contrast images
    • Treacy M.M.J., and Gibson J.M. Coherence and multiple-scattering in z-contrast images. Ultramicroscopy 52 (1993) 31-53
    • (1993) Ultramicroscopy , vol.52 , pp. 31-53
    • Treacy, M.M.J.1    Gibson, J.M.2
  • 80
    • 0028853755 scopus 로고
    • Atomic contrast transfer in annular dark-field images
    • Treacy M.M.J., and Gibson J.M. Atomic contrast transfer in annular dark-field images. J. Microsc. 180 (1995) 2-11
    • (1995) J. Microsc. , vol.180 , pp. 2-11
    • Treacy, M.M.J.1    Gibson, J.M.2
  • 81
    • 0018032284 scopus 로고
    • Z contrast imaging of platinum and palladium catalysts
    • Treacy M.M.J., Howie A., and Wilson C.J. Z contrast imaging of platinum and palladium catalysts. Phil. Mag. A 38 (1978) 569-585
    • (1978) Phil. Mag. A , vol.38 , pp. 569-585
    • Treacy, M.M.J.1    Howie, A.2    Wilson, C.J.3
  • 82
    • 0001822419 scopus 로고
    • A new proceedure for wave function restoration in high resolution electron microscopy
    • Van Dyck D., and Coene W. A new proceedure for wave function restoration in high resolution electron microscopy. Optik 77 (1987) 125-128
    • (1987) Optik , vol.77 , pp. 125-128
    • Van Dyck, D.1    Coene, W.2
  • 83
    • 0030221724 scopus 로고    scopus 로고
    • A simple intuitive theory for electron diffraction
    • Van Dyck D., and Op de Beeck M. A simple intuitive theory for electron diffraction. Ultramicroscopy 64 (1996) 99-107
    • (1996) Ultramicroscopy , vol.64 , pp. 99-107
    • Van Dyck, D.1    Op de Beeck, M.2
  • 84
    • 0016942567 scopus 로고
    • Concerning tilted beam electron microscope transfer function
    • Wade R.H. Concerning tilted beam electron microscope transfer function. Optik 45 (1976) 87-91
    • (1976) Optik , vol.45 , pp. 87-91
    • Wade, R.H.1
  • 85
    • 0017541997 scopus 로고
    • Electron microscope transfer functions for partially coherent axial illumination and chromatic defocus spread
    • Wade R.H., and Frank J. Electron microscope transfer functions for partially coherent axial illumination and chromatic defocus spread. Optik 49 (1977) 81-92
    • (1977) Optik , vol.49 , pp. 81-92
    • Wade, R.H.1    Frank, J.2
  • 86
    • 0012991497 scopus 로고
    • Scanning transmission electron microscopy
    • Zeitler E., and Thomson M.G.R. Scanning transmission electron microscopy. Optik 31 (1970) 258-280
    • (1970) Optik , vol.31 , pp. 258-280
    • Zeitler, E.1    Thomson, M.G.R.2
  • 87
    • 0012991497 scopus 로고
    • Scanning transmission electron microscopy
    • Zeitler E., and Thomson M.G.R. Scanning transmission electron microscopy. Optik 31 (1970) 359-366
    • (1970) Optik , vol.31 , pp. 359-366
    • Zeitler, E.1    Thomson, M.G.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.