Retrieval of crystal defect structures from HREM images by simulated evolution. I. Basic technique

Ultramicroscopy

Volumn 65, Issue 3-4, 1996, Pages 205-216

  Mobus G ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; COMPUTER SIMULATION; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGING TECHNIQUES; INTERFACES (MATERIALS); ITERATIVE METHODS; NUMERICAL METHODS; OPTIMIZATION; SIGNAL TO NOISE RATIO;

ITERATIVE DIGITAL IMAGE MATCHING;

CRYSTAL DEFECTS;

ARTICLE; COMPUTER SIMULATION; ELECTRON MICROSCOPY;

EID: 0030272104     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00073-3     Document Type: Article

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