Time and frequency domain characterization of transistor self-heating

IEEE Transactions on Electron Devices

Volumn 60, Issue 6, 2013, Pages 1844-1851

  Makovejev, Sergej ^a,b   Olsen, Sarah H ^a   Kilchytska, Valeriya ^b   Raskin, Jean Pierre ^b  

^a NEWCASTLE UNIVERSITY   (United Kingdom)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

Pulsed I V; RF; self heating; silicon on insulator (SOI)

Indexed keywords

PARTIALLY DEPLETED SOI DEVICES; PULSED I-V; RF; RF CHARACTERIZATION; SELF-HEATING; SILICON-ON- INSULATORS (SOI); SILICON-ON-INSULATOR MOSFETS; TIME AND FREQUENCY DOMAINS;

MOSFET DEVICES;

FREQUENCY DOMAIN ANALYSIS;

EID: 84878134982     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2013.2259174     Document Type: Article

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