On extraction of self-heating features in UTBB SOI MOSFETs

2012 13th International Conference on Ultimate Integration on Silicon, ULIS 2012

Volumn , Issue , 2012, Pages 109-112

  Makovejev, S ^a   Olsen, S ^a   Andrieu, F ^b   Poiroux, T ^b   Faynot, O ^b   Flandre, D ^c   Raskin, J P ^c   Kilchytska, V ^c  

^a NEWCASTLE UNIVERSITY   (United Kingdom)

^b CEA LETI   (France)

^c UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

pulsed I V; RF characterisation; self heatimg; SOI; UTBB

Indexed keywords

PULSED I-V; RF CHARACTERISATION; SELF-HEATIMG; SOI; UTBB;

DEGRADATION;

MOSFET DEVICES;

EID: 84861204685     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ULIS.2012.6193369     Document Type: Conference Paper

References (12)

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