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Volumn , Issue , 2003, Pages 883-886
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Thermal Analysis of Ultra-Thin Body Device Scaling
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Author keywords
[No Author keywords available]
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Indexed keywords
BIASING TECHNIQUES;
ISOTHERMAL SCALING;
ULTRA-THIN BODY (UTB);
DISPERSION (WAVES);
ELECTROSTATICS;
EPITAXIAL GROWTH;
HEAT CONDUCTION;
HEAT PROBLEMS;
HEAT RESISTANCE;
NANOSTRUCTURED MATERIALS;
PHONONS;
SCATTERING;
SEMICONDUCTOR DEVICE MODELS;
SILICON ON INSULATOR TECHNOLOGY;
SPECIFIC HEAT OF SOLIDS;
THERMAL CONDUCTIVITY OF SOLIDS;
THERMAL EFFECTS;
THIN FILM TRANSISTORS;
ULTRATHIN FILMS;
GATES (TRANSISTOR);
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EID: 0842309721
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (55)
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References (20)
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