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Volumn 32, Issue 10-11, 2001, Pages 847-853

A lumped transient thermal model for self-heating in MOSFETs

Author keywords

MOSFET; Self heating; Thermal modeling

Indexed keywords

SELF-HEATING EFFECTS (SHE); THERMAL MODELING;

EID: 0035480150     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(01)00072-6     Document Type: Article
Times cited : (21)

References (18)
  • 1
    • 84889156751 scopus 로고
    • Temperature increases by self-heating in VLSI CMOS
    • Bologna, Editions Frontiers/Seguier. Atlantica, Paris
    • (1987) ESSDERC 1987 , pp. 59-62
    • Takacs, D.1    Trager, J.2
  • 4
    • 0029307806 scopus 로고
    • An analytical drain current model considering both electron and lattice temperature simultaneously for deep submicron ultra-thin SOI NMOS devices with self-heating
    • (1995) IEEE Trans. Electron Devices Lett. , vol.42 , pp. 889-906
    • Chen, Y.1
  • 16
    • 84889127096 scopus 로고
    • Rigorous thermodynamic treatment of heat generation and conduction in semiconductor device modeling, Computer aided design of integrated circuits and systems
    • (1990) IEEE Trans. , vol.9 , Issue.11
    • Wachutka, G.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.