Self-Heating Characterization and Extraction Method for Thermal Resistance and Capacitance in HV MOSFETs

IEEE Electron Device Letters

Volumn 25, Issue 3, 2004, Pages 141-143

  Anghel, Costin ^a   Gillon, Renaud ^b   Ionescu, Adrian Mihai ^a  

^a EPFL   (Switzerland)

^b ON SEMICONDUCTOR   (United States)

Author keywords

High voltage (HV) DMOSFETs; Self heating effect (SHE); Thermal capacitance; Thermal resistance

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC CURRENT MEASUREMENT; ELECTRIC IMPEDANCE; ELECTRON MOBILITY; HEAT RESISTANCE; PULSE GENERATORS; SEMICONDUCTOR DEVICE MODELS; VOLTAGE MEASUREMENT;

HIGH-VOLTAGE (HV) DMOSFETS; SELF-HEATING EFFECT (SHE; THERMAL CAPACITANCE;

MOSFET DEVICES;

EID: 1642349452     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2003.821669     Document Type: Article

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