Seeing the atoms more clearly: STEM imaging from the Crewe era to today

Ultramicroscopy

Volumn 123, Issue , 2012, Pages 28-37

  Pennycook, S J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Aberration correction; Atomic resolution; Electron energy loss spectroscopy; Scanning transmission electron microscopy; Z contrast

Indexed keywords

ABERRATION CORRECTION; ATOMIC RESOLUTION; DYNAMICAL DIFFRACTION; INCOHERENT IMAGING; LENS ABERRATION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SINGLE ATOMS; TWO-DIMENSIONAL SPECTRA; Z-CONTRAST; Z-CONTRAST IMAGING;

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; TRANSMISSION ELECTRON MICROSCOPY;

ATOMS;

ANALYTICAL PARAMETERS; ARTICLE; ATOM; CONTRAST; DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE ANALYSIS; IMAGE DISPLAY; LIGHT SCATTERING; MOLECULAR IMAGING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SENSITIVITY ANALYSIS; ANALYTIC METHOD; IMAGE QUALITY; MOLECULAR PHYSICS; PHASE CONTRAST MICROSCOPY; SEMICONDUCTOR; SIMULATION; SPECTROMETER; STOICHIOMETRY; SUPERCONDUCTOR; EQUIPMENT; METHODOLOGY; REVIEW;

MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; SPECTROSCOPY, ELECTRON ENERGY-LOSS;

EID: 84870412734     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.05.005     Document Type: Article

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