Advancing the hexapole Cs-corrector for the scanning transmission electron microscope

Microscopy and Microanalysis

Volumn 12, Issue 6, 2006, Pages 442-455

  Müller, Heiko ^a   Uhlemann, Stephan ^a   Hartel, Peter ^a   Haider, Maximilian ^a  

^a CEOS Corrected Electron Optical Systems GmbH   (Germany)

Author keywords

Aberration; Corrector; Hexapole; Monochromator; Probe size; Resolution; STEM

Indexed keywords

EID: 33947513014     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606060600     Document Type: Conference Paper

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