Observation of rare-earth segregation in silicon nitride ceramics at subnanometre dimensions

Nature

Volumn 428, Issue 6984, 2004, Pages 730-733

  Shibata, Naoya ^a   Pennycook, Stephen J ^a   Gosnell, Tim R ^b   Painter, Gayle S ^a   Shelton, William A ^a   Becher, Paul F ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Pixon LLC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ANISOTROPY; GRAIN BOUNDARIES; MICROSTRUCTURE; RARE EARTH ADDITIONS; SILICON NITRIDE; STRUCTURAL DESIGN; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLINE SURFACES; DOPANT ATOMS (LA); DOPANT EFFECTS; NANOMETER-SCALE;

CERAMIC MATERIALS;

CERAMICS;

ANISOTROPY; ARTICLE; ATOM; CALCULATION; CERAMICS; CHEMICAL STRUCTURE; CRYSTAL; FILM; PARAMETER; PARTICLE SIZE; PRIORITY JOURNAL; SEGREGATION ANALYSIS; STRUCTURE ANALYSIS; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 1942455803     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/nature02410     Document Type: Article

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