SESAM: Exploring the frontiers of electron microscopy

Microscopy and Microanalysis

Volumn 12, Issue 6, 2006, Pages 506-514

  Koch, Christoph T ^a   Sigle, Wilfried ^a   Höschen, Rainer ^a   Rühle, Manfred ^a   Essers, Erik ^b   Benner, Gerd ^b   Matijevic, Marko ^b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b CARL ZEISS SMT AG   (Germany)

Author keywords

EELS; Energy filter aberrations; Energy filtered electron diffraction; Energy filtered TEM

Indexed keywords

EID: 33947509713     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606060624     Document Type: Conference Paper

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