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Journal of Electron Microscopy

Volumn 50, Issue 3, 2001, Pages 177-185

Progress in aberration-corrected scanning transmission electron microscopy

(5) Dellby, N a Krivaneka, L a Nellist, D a Batson, E b Lupini, R c

a Nion Co Kirkland (United States)

b IBM T J WATSON RESEARCH CENTER (United States)

c UNIVERSITY OF CAMBRIDGE (United Kingdom)

Author keywords

Aberration correction; High resolution electron microscopy; Ronchigram analysis; Scanning transmission electron microscopy; Spherical aberration

Indexed keywords

ARTICLE;

ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY;

ABERRATION CORRECTION; ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPIES; HIGH-ANGLE ANNULAR DARK-FIELD IMAGES; OCTUPOLES; OVERALL STABILITIES; RONCHIGRAM ANALYSE; RONCHIGRAMS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPHERICAL ABERRATIONS;

ABERRATIONS;

EID: 0034935648 PISSN: 00220744 EISSN: None Source Type: Journal
DOI: 10.1093/jmicro/50.3.177 Document Type: Article

Times cited : (241)

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