Position dependence of the visibility of a single gold atom in silicon crystals in HAADF-STEM image simulation

Journal of Electron Microscopy

Volumn 46, Issue 1, 1997, Pages 33-43

  Nakamura, Kuniyasu ^a   Kakibayashi, Hiroshi ^a   Kanehori, Keiichi ^a   Tanaka, Nobuo ^b  

^a HITACHI LTD   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

Au atom Si crystal; channelling effect; high angle annular dark field scanning transmission electron microscope (HAADF STEM); multislice image simulation; single atom visibility; thermal diffuse scattering (TDS)

Indexed keywords

ELECTRONS; GOLD; PROBES; TRANSMISSION ELECTRON MICROSCOPY; VISIBILITY;

AU ATOM/SI CRYSTAL,; CHANNELING EFFECT; CHANNELING EFFECT,; DIFFUSE SCATTERING; HIGH-ANGLE ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPE ,; HIGH-ANGLE-ANNULAR-DARK-FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPES; IMAGES SIMULATIONS; MULTI SLICES; MULTISLICE IMAGE SIMULATION,; SI CRYSTALS; SINGLE ATOM VISIBILITY.; SINGLE-ATOMS; THERMAL; THERMAL DIFFUSE SCATTERING (IDS).;

ATOMS;

EID: 0030979935     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023488     Document Type: Article

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