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Volumn 108, Issue 6, 2010, Pages

Infrared birefringence imaging of residual stress and bulk defects in multicrystalline silicon

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE IMAGING; BULK DEFECTS; CELL MANUFACTURING; CONTROL TECHNIQUES; INDUSTRIAL SOLAR CELLS; INTERNAL STRESS; LOCAL STRESS; MECHANICAL STRENGTH; METAL PRECIPITATION; MICRO-DEFECTS; MINORITY CARRIER LIFETIMES; MULTI-CRYSTALLINE SILICON; MULTICRYSTALLINE SILICON (MC-SI); SI SOLAR CELLS; SOLAR CELL MATERIALS; STRESS MAGNITUDE;

EID: 77957735395     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3468404     Document Type: Article
Times cited : (62)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.