Correlation of spatially resolved lifetime measurements with overall solar cell parameters

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 198-201

  Isenberg, J ^a   Dicker, J ^a   Riepe, S ^a   Ballif, C ^a   Peters, S ^a   Lautenschlager, H ^a   Schindler, R ^a   Warta, W ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIREFLECTION COATINGS; ELECTRIC RESISTANCE; PASSIVATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICON NITRIDE; SILICON WAFERS;

BRIDGMAN-GROWN MULTICRYSTALLINE SILICON; CARRIER DENSITY IMAGING MEASUREMENTS; GETTERING;

SILICON SOLAR CELLS;

EID: 0036948622     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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