Local measurements of diffusion length and chemical character of metal clusters in multicrystalline silicon

Solid State Phenomena

Volumn 108-109, Issue , 2005, Pages 577-584

  Buonassisi, T ^a   Istratov, A A ^a   Marcus, M A ^b   Heuer, M ^a   Pickett, M D ^a   Lai, B ^c   Cai, Z ^c   Heald, S M ^d   Weber, E R ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

Copper; Gettering; Iron; Metal impurity precipitates; Nickel; Solar cells; Synchrotron; X ray absorption spectroscopy; X ray fluorescence

Indexed keywords

CHEMICAL ANALYSIS; COPPER; DEFECTS; DIFFUSION; FLUORESCENCE; FLUORESCENCE MICROSCOPY; IRON; NICKEL; POLYSILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SOLAR CELLS; SYNCHROTRONS; X RAY ABSORPTION SPECTROSCOPY;

GETTERING; METAL IMPURITIES; MINORITY CARRIER DIFFUSION LENGTH; MULTI-CRYSTALLINE SILICON; MULTICRYSTALLINE SILICON (MC-SI); SOLAR CELL MATERIALS; X RAY FLUORESCENCE; X-RAY FLUORESCENCE MICROSCOPY;

METALS;

EID: 30344436493     PISSN: 10120394     EISSN: 16629779     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/SSP.108-109.577     Document Type: Conference Paper

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