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Volumn 6, Issue 7, 2004, Pages 594-598
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Biaxial fracture test of silicon wafers
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Author keywords
[No Author keywords available]
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Indexed keywords
BENDING TOOLS;
ELASTICITY;
FINITE ELEMENT METHOD;
FRACTURE TOUGHNESS;
INGOTS;
PLATE METAL;
SAWING;
SOLAR CELLS;
STATISTICAL METHODS;
STRESSES;
WEIBULL DISTRIBUTION;
BIAXIAL FRACTURE;
CRACK DENSITY;
FRACTURE STRESSES;
WAFERS;
SILICON WAFERS;
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EID: 4043048698
PISSN: 14381656
EISSN: None
Source Type: Journal
DOI: 10.1002/adem.200400406 Document Type: Article |
Times cited : (57)
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References (10)
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