Synchrotron-based impurity mapping

Journal of Crystal Growth

Volumn 210, Issue 1, 2000, Pages 395-400

  McHugo, S A ^a   Thompson, A C ^a   Flink, C ^a   Weber, E R ^a,b   Lamble, G ^a   Gunion, B ^a   MacDowell, A ^a   Celestre, R ^a   Padmore, H A ^a   Hussain, Z ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CRYSTAL IMPURITIES; DISSOLUTION; HEAT TREATMENT; PRECIPITATION (CHEMICAL); SILICON SOLAR CELLS; X RAY SPECTROSCOPY;

X-RAY ABSORPTION SPECTROSCOPY (XAS);

SEMICONDUCTING SILICON;

EID: 0033893288     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00718-6     Document Type: Article

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