Modeling the effect of dislocations on the minority carrier diffusion length of a semiconductor

Journal of Applied Physics

Volumn 84, Issue 5, 1998, Pages 2656-2664

  Donolato, C ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001398889     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368378     Document Type: Article

References (24)

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