Measurement of the normalized recombination strength of dislocations in multicrystalline silicon solar cells

Solid State Phenomena

Volumn 82-84, Issue , 2002, Pages 701-706

  Rinio, M ^a   Peters, S ^a   Werner, M ^a   Lawerenz, A ^a   Moller H J ^a  

^a TU BERGAKADEMIE FREIBERG   (Germany)

Author keywords

Dislocation strength; Dislocations; LBIC; Recombination; RTP; Silicon; Solar cells

Indexed keywords

COMPUTER APPLICATIONS; DISLOCATIONS (CRYSTALS); SILICON; SOLAR CELLS; STRENGTH OF MATERIALS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

LIGHT BEAM INDUCED CURRENT; MULTICRYSTALLINE SILICON SOLAR CELL; NORMALIZED RECOMBINATION STRENGTH; RAPID THERMAL PROCESS;

CRYSTALLINE MATERIALS;

EID: 0036131644     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (8)