Quantitative Evaluation of Shunts in Solar Cells by Lock-In Thermography

Progress in Photovoltaics: Research and Applications

Volumn 11, Issue 8, 2003, Pages 515-526

  Breitenstein, O ^a   Rakotoniaina, J P ^a   Al Rifai, M H ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

Efficiency; I V characteristic; LIVT; Lock in; Low light level performance; Shunts; Thermography

Indexed keywords

CAMERAS; CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; IMAGE ANALYSIS; PLASTIC FILMS; THERMOGRAPHY (IMAGING);

DIRECT MEMORY ACCESS (DMA); MULTICRYSTALLINE SOLAR CELLS;

SOLAR CELLS;

PHOTOVOLTAIC SYSTEM;

EID: 0347365806     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/pip.520     Document Type: Article

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