Photoelastic characterization on multicrystalline silicon substrates for solar cell

Materials Science in Semiconductor Processing

Volumn 9, Issue 1-3, 2006, Pages 266-269

  Fukuzawa, M ^a   Yamada, M ^a  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Infrared polariscope; Multicrystalline silicon; Residual strain; Solar cell; Thermal stress

Indexed keywords

BIREFRINGENCE; CONCENTRATION (PROCESS); PHOTOELASTICITY; REFRACTIVE INDEX; SILICON; SOLAR CELLS; SUBSTRATES; THERMAL STRESS;

CASTING TECHNIQUES; INFRARED POLARISCOPE; MULTICRYSTALLINE SILICON; RESIDUAL STRAIN;

CRYSTALLINE MATERIALS;

EID: 33744535426     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2006.01.043     Document Type: Article

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