-
1
-
-
49749114396
-
-
JVTBD9 1071-1023, 10.1116/1.2955728
-
I. Utke, P. Hoffmann, and J. Melngailis, J. Vac. Sci. Technol. B JVTBD9 1071-1023 26, 1197 (2008). 10.1116/1.2955728
-
(2008)
J. Vac. Sci. Technol. B
, vol.26
, pp. 1197
-
-
Utke, I.1
Hoffmann, P.2
Melngailis, J.3
-
2
-
-
1942536985
-
-
JCRGAE 0022-0248, 10.1016/j.jcrysgro.2004.02.006
-
F. Cicoira, K. Leifer, P. Hoffmann, I. Utke, B. Dwir, D. Laub, P. A. Buffat, E. Kapon, and P. Doppelt, J. Cryst. Growth JCRGAE 0022-0248 265, 619 (2004). 10.1016/j.jcrysgro.2004.02.006
-
(2004)
J. Cryst. Growth
, vol.265
, pp. 619
-
-
Cicoira, F.1
Leifer, K.2
Hoffmann, P.3
Utke, I.4
Dwir, B.5
Laub, D.6
Buffat, P.A.7
Kapon, E.8
Doppelt, P.9
-
3
-
-
33947145153
-
TEM study of annealed Pt nanostructures grown by electron beam-induced deposition
-
DOI 10.1016/j.physe.2006.06.018, PII S1386947706003651
-
S. Frabboni, G. C. Gazzadi, and A. Spessot, Physica E (Amsterdam) PELNFM 1386-9477 37, 265 (2007). 10.1016/j.physe.2006.06.018 (Pubitemid 46401443)
-
(2007)
Physica E: Low-Dimensional Systems and Nanostructures
, vol.37
, Issue.1-2
, pp. 265-269
-
-
Frabboni, S.1
Gazzadi, G.C.2
Spessot, A.3
-
5
-
-
0030111011
-
-
SCNNDF 0161-0457
-
N. A. Kislov, I. I. Khodos, E. D. Ivanov, and J. Barthel, Scanning SCNNDF 0161-0457 18, 114 (1996).
-
(1996)
Scanning
, vol.18
, pp. 114
-
-
Kislov, N.A.1
Khodos, I.I.2
Ivanov, E.D.3
Barthel, J.4
-
6
-
-
0000611089
-
-
JVTBD9 1071-1023, 10.1116/1.588008
-
H. W. P. Koops, A. Kaya, and M. Weber, J. Vac. Sci. Technol. B JVTBD9 1071-1023 13, 2400 (1995). 10.1116/1.588008
-
(1995)
J. Vac. Sci. Technol. B
, vol.13
, pp. 2400
-
-
Koops, H.W.P.1
Kaya, A.2
Weber, M.3
-
7
-
-
84957332009
-
-
JAPNDE 0021-4922, 10.1143/JJAP.33.7099
-
H. W. P. Koops, J. Kretz, M. Rudolph, M. Weber, G. Dahm, and K. L. Lee, Jpn. J. Appl. Phys., Part 1 JAPNDE 0021-4922 33, 7099 (1994). 10.1143/JJAP.33.7099
-
(1994)
Jpn. J. Appl. Phys., Part 1
, vol.33
, pp. 7099
-
-
Koops, H.W.P.1
Kretz, J.2
Rudolph, M.3
Weber, M.4
Dahm, G.5
Lee, K.L.6
-
8
-
-
0344256630
-
Solid gold nanostructures fabricated by electron beam deposition
-
DOI 10.1021/nl034528o
-
K. Mølhave, D. N. Madsen, A. M. Rasmussen, A. Carlsson, C. C. Appel, M. Brorson, C. J. H. Jacobsen, and P. Boøggild, Nano Lett. NALEFD 1530-6984 3, 1499 (2003). 10.1021/nl034528o (Pubitemid 37518160)
-
(2003)
Nano Letters
, vol.3
, Issue.11
, pp. 1499-1503
-
-
Molhave, K.1
Madsen, D.N.2
Rasmussen, A.M.3
Carlsson, A.4
Appel, C.C.5
Brorson, M.6
Jacobsen, C.J.H.7
Boggild, P.8
-
9
-
-
33847697822
-
Nanostructure fabrication by ultra-high-resolution environmental scanning electron microscopy
-
DOI 10.1021/nl062848c
-
M. Toth, C. J. Lobo, W. R. Knowles, M. R. Phillips, M. T. Postek, and A. E. Vladar, Nano Lett. NALEFD 1530-6984 7, 525 (2007). 10.1021/nl062848c (Pubitemid 46383626)
-
(2007)
Nano Letters
, vol.7
, Issue.2
, pp. 525-530
-
-
Toth, M.1
Lobo, C.J.2
Knowles, W.R.3
Phillips, M.R.4
Postek, M.T.5
Vladar, A.E.6
-
10
-
-
0034317713
-
Focused electron beam induced deposition of gold
-
DOI 10.1116/1.1319690
-
I. Utke, P. Hoffmann, B. Dwir, K. Leifer, E. Kapon, and P. Doppelt, J. Vac. Sci. Technol. B JVTBD9 1071-1023 18, 3168 (2000). 10.1116/1.1319690 (Pubitemid 32088177)
-
(2000)
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
, vol.18
, Issue.6
, pp. 3168-3171
-
-
Utke, I.1
Hoffmann, P.2
Dwir, B.3
Leifer, K.4
Kapon, E.5
Doppelt, P.6
-
11
-
-
79956037527
-
Focused-electron-beam-induced deposition of freestanding three-dimensional nanostructures of pure coalesced copper crystals
-
DOI 10.1063/1.1517180
-
I. Utke, A. Luisier, P. Hoffmann, D. Laub, and P. A. Buffat, Appl. Phys. Lett. APPLAB 0003-6951 81, 3245 (2002). 10.1063/1.1517180 (Pubitemid 35360552)
-
(2002)
Applied Physics Letters
, vol.81
, Issue.17
, pp. 3245
-
-
Utke, I.1
Luisier, A.2
Hoffmann, P.3
Laub, D.4
Buffat, P.A.5
-
12
-
-
29744459849
-
Logarithmic behavior of the conductivity of electron-beam deposited granular Pt C nanowires
-
DOI 10.1103/PhysRevB.72.233407, 233407
-
L. Rotkina, S. Oh, J. N. Eckstein, and S. V. Rotkin, Phys. Rev. B PRBMDO 0163-1829 72, 233407 (2005). 10.1103/PhysRevB.72.233407 (Pubitemid 43029187)
-
(2005)
Physical Review B - Condensed Matter and Materials Physics
, vol.72
, Issue.23
, pp. 1-4
-
-
Rotkina, L.1
Oh, S.2
Eckstein, J.N.3
Rotkin, S.V.4
-
13
-
-
2542499189
-
-
MIENEF 0167-9317, 10.1016/S0167-9317(04)00138-8
-
I. Utke, T. Bret, D. Laub, P. Buffat, L. Scandella, and P. Hoffmann, Microelectron. Eng. MIENEF 0167-9317 73-74, 553 (2004). 10.1016/S0167-9317(04) 00138-8
-
(2004)
Microelectron. Eng.
, vol.73-74
, pp. 553
-
-
Utke, I.1
Bret, T.2
Laub, D.3
Buffat, P.4
Scandella, L.5
Hoffmann, P.6
-
14
-
-
72849124957
-
-
JVTBD9 1071-1023, 10.1116/1.3253551
-
A. Botman, C. W. Hagen, J. Li, B. L. Thiel, K. A. Dunn, J. J. L. Mulders, S. Randolph, and M. Toth, J. Vac. Sci. Technol. B JVTBD9 1071-1023 27, 2759 (2009). 10.1116/1.3253551
-
(2009)
J. Vac. Sci. Technol. B
, vol.27
, pp. 2759
-
-
Botman, A.1
Hagen, C.W.2
Li, J.3
Thiel, B.L.4
Dunn, K.A.5
Mulders, J.J.L.6
Randolph, S.7
Toth, M.8
-
15
-
-
47549099794
-
-
APPLAB 0003-6951, 10.1063/1.2959112
-
J. Li, M. Toth, V. Tileli, K. A. Dunn, C. J. Lobo, and B. L. Thiel, Appl. Phys. Lett. APPLAB 0003-6951 93, 023130 (2008). 10.1063/1.2959112
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 023130
-
-
Li, J.1
Toth, M.2
Tileli, V.3
Dunn, K.A.4
Lobo, C.J.5
Thiel, B.L.6
-
16
-
-
0346215978
-
-
APPLAB 0003-6951, 10.1063/1.1629382
-
L. Rotkina, J. F. Lin, and J. P. Bird, Appl. Phys. Lett. APPLAB 0003-6951 83, 4426 (2003). 10.1063/1.1629382
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 4426
-
-
Rotkina, L.1
Lin, J.F.2
Bird, J.P.3
-
17
-
-
0034206448
-
-
MIENEF 0167-9317, 10.1016/S0167-9317(00)00311-7
-
T. Utke, B. Dwir, K. Leifer, F. Cicoira, P. Doppelt, P. Hoffmann, and E. Kapon, Microelectron. Eng. MIENEF 0167-9317 53, 261 (2000). 10.1016/S0167- 9317(00)00311-7
-
(2000)
Microelectron. Eng.
, vol.53
, pp. 261
-
-
Utke, T.1
Dwir, B.2
Leifer, K.3
Cicoira, F.4
Doppelt, P.5
Hoffmann, P.6
Kapon, E.7
-
18
-
-
27944436102
-
Fabrication and electron holography characterization of FePt alloy nanorods
-
DOI 10.1063/1.2136071, 223109
-
R. C. Che, M. Takeguchi, M. Shimojo, W. Zhang, and K. Furuya, Appl. Phys. Lett. APPLAB 0003-6951 87, 223109 (2005). 10.1063/1.2136071 (Pubitemid 41669262)
-
(2005)
Applied Physics Letters
, vol.87
, Issue.22
, pp. 1-3
-
-
Che, R.C.1
Takeguchi, M.2
Shimojo, M.3
Zhang, W.4
Furuya, K.5
-
19
-
-
33845246163
-
4
-
DOI 10.1116/1.2395962
-
J. D. Barry, M. Ervin, J. Molstad, A. Wickenden, T. Brintlinger, P. Hoffman, and J. Meingailis, J. Vac. Sci. Technol. A JVTAD6 0734-2101 24, 3165 (2006). 10.1116/1.2395962 (Pubitemid 44866489)
-
(2006)
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
, vol.24
, Issue.6
, pp. 3165-3168
-
-
Barry, J.D.1
Ervin, M.2
Molstad, J.3
Wickenden, A.4
Brintlinger, T.5
Hoffman, P.6
Meingailis, J.7
-
20
-
-
33748895082
-
Purification of platinum and gold structures after electron-beam-induced deposition
-
DOI 10.1088/0957-4484/17/15/028, PII S0957448406241163, 028
-
A. Botman, J. J. L. Mulders, R. Weemaes, and S. Mentink, Nanotechnology NNOTER 0957-4484 17, 3779 (2006). 10.1088/0957-4484/17/15/028 (Pubitemid 44424412)
-
(2006)
Nanotechnology
, vol.17
, Issue.15
, pp. 3779-3785
-
-
Botman, A.1
Mulders, J.J.L.2
Weemaes, R.3
Mentink, S.4
-
21
-
-
9644282924
-
-
NALEFD 1530-6984, 10.1021/nl0492133
-
V. Gopal, V. R. Radmilovic, C. Daraio, S. Jin, P. Yang, and E. A. Stach, Nano Lett. NALEFD 1530-6984 4, 2059 (2004). 10.1021/nl0492133
-
(2004)
Nano Lett.
, vol.4
, pp. 2059
-
-
Gopal, V.1
Radmilovic, V.R.2
Daraio, C.3
Jin, S.4
Yang, P.5
Stach, E.A.6
-
22
-
-
0000621557
-
-
JVTBD9 1071-1023, 10.1116/1.588994
-
A. Folch, J. Servat, J. Esteve, J. Tejada, and M. Seco, J. Vac. Sci. Technol. B JVTBD9 1071-1023 14, 2609 (1996). 10.1116/1.588994
-
(1996)
J. Vac. Sci. Technol. B
, vol.14
, pp. 2609
-
-
Folch, A.1
Servat, J.2
Esteve, J.3
Tejada, J.4
Seco, M.5
-
23
-
-
36449000800
-
-
APPLAB 0003-6951, 10.1063/1.113909
-
A. Folch, J. Tejada, C. H. Peters, and M. S. Wrighton, Appl. Phys. Lett. APPLAB 0003-6951 66, 2080 (1995). 10.1063/1.113909
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 2080
-
-
Folch, A.1
Tejada, J.2
Peters, C.H.3
Wrighton, M.S.4
-
24
-
-
0001679513
-
-
JVTBD9 1071-1023, 10.1116/1.584045
-
H. W. P. Koops, R. Weiel, D. P. Kern, and T. H. Baum, J. Vac. Sci. Technol. B JVTBD9 1071-1023 6, 477 (1988). 10.1116/1.584045
-
(1988)
J. Vac. Sci. Technol. B
, vol.6
, pp. 477
-
-
Koops, H.W.P.1
Weiel, R.2
Kern, D.P.3
Baum, T.H.4
-
25
-
-
29044443037
-
Electrodes for carbon nanotube devices by focused electron beam induced deposition of gold
-
DOI 10.1116/1.2130355
-
T. Brintlinger, M. S. Fuhrer, J. Melngailis, I. Utke, T. Bret, A. Perentes, P. Hoffmann, M. Abourida, and P. Doppelt, J. Vac. Sci. Technol. B JVTBD9 1071-1023 23, 3174 (2005). 10.1116/1.2130355 (Pubitemid 41788832)
-
(2005)
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
, vol.23
, Issue.6
, pp. 3174-3177
-
-
Brintlinger, T.1
Fuhrer, M.S.2
Melngailis, J.3
Utke, I.4
Bret, T.5
Perentes, A.6
Hoffmann, P.7
Abourida, M.8
Doppelt, P.9
-
26
-
-
33845252952
-
Direct wiring of carbon nanotubes for integration in nanoelectromechanical systems
-
DOI 10.1116/1.2388965
-
S. Bauerdick, A. Linden, C. Stampfer, T. Helbling, and C. Hierold, J. Vac. Sci. Technol. B JVTBD9 1071-1023 24, 3144 (2006). 10.1116/1.2388965 (Pubitemid 44866484)
-
(2006)
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
, vol.24
, Issue.6
, pp. 3144-3147
-
-
Bauerdick, S.1
Linden, A.2
Stampfer, C.3
Helbling, T.4
Hierold, C.5
-
27
-
-
0007894698
-
-
JAPNDE 0021-4922, 10.1143/JJAP.35.6623
-
H. Morimoto, T. Kishimoto, M. Takai, S. Yura, A. Hosono, S. Okuda, S. Lipp, L. Frey, and H. Ryssel, Jpn. J. Appl. Phys., Part 1 JAPNDE 0021-4922 35, 6623 (1996). 10.1143/JJAP.35.6623
-
(1996)
Jpn. J. Appl. Phys., Part 1
, vol.35
, pp. 6623
-
-
Morimoto, H.1
Kishimoto, T.2
Takai, M.3
Yura, S.4
Hosono, A.5
Okuda, S.6
Lipp, S.7
Frey, L.8
Ryssel, H.9
-
28
-
-
33749484045
-
-
HIECAP 0018-1439, 10.1007/s10733-005-0015-4
-
M. A. Bruk, E. N. Zhikharev, E. I. Grigorev, A. V. Spirin, V. A. Kalnov, and I. E. Kardash, High Energy Chem. HIECAP 0018-1439 39, 65 (2005). 10.1007/s10733-005-0015-4
-
(2005)
High Energy Chem.
, vol.39
, pp. 65
-
-
Bruk, M.A.1
Zhikharev, E.N.2
Grigorev, E.I.3
Spirin, A.V.4
Kalnov, V.A.5
Kardash, I.E.6
-
29
-
-
11844266514
-
Auger electron spectroscopy analysis of high metal content micro-structures grown by electron beam induced deposition
-
DOI 10.1016/j.apsusc.2004.08.005, PII S0169433204012681
-
F. Cicoira, P. Hoffmann, C. O. A. Olsson, N. Xanthopoulos, H. J. Mathieu, and P. Doppelt, Appl. Surf. Sci. ASUSEE 0169-4332 242, 107 (2005). 10.1016/j.apsusc.2004.08.005 (Pubitemid 40086048)
-
(2005)
Applied Surface Science
, vol.242
, Issue.1-2
, pp. 107-113
-
-
Cicoira, F.1
Hoffmann, P.2
Olsson, C.O.A.3
Xanthopoulos, N.4
Mathieu, H.J.5
Doppelt, P.6
-
30
-
-
44149110141
-
-
MIENEF 0167-9317, 10.1016/j.mee.2007.12.036
-
A. Botman, M. Hesselberth, and J. J. L. Mulders, Microelectron. Eng. MIENEF 0167-9317 85, 1139 (2008). 10.1016/j.mee.2007.12.036
-
(2008)
Microelectron. Eng.
, vol.85
, pp. 1139
-
-
Botman, A.1
Hesselberth, M.2
Mulders, J.J.L.3
-
31
-
-
31844432302
-
Transport properties of Pt nanowires fabricated by beam-induced deposition
-
DOI 10.1143/JJAP.44.5683
-
Y. Tsukatani, N. Yamasaki, K. Murakami, F. Wakaya, and M. Takai, Jpn. J. Appl. Phys., Part 1 JAPNDE 0021-4922 44, 5683 (2005). 10.1143/JJAP.44.5683 (Pubitemid 43182985)
-
(2005)
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
, vol.44
, Issue.7 B
, pp. 5683-5686
-
-
Tsukatani, Y.1
Yamasaki, N.2
Murakami, K.3
Wakaya, F.4
Takai, M.5
-
32
-
-
70349111136
-
-
NNOTER 0957-4484, 10.1088/0957-4484/20/37/372001
-
A. Botman, J. J. L. Mulders, and C. W. Hagen, Nanotechnology NNOTER 0957-4484 20, 372001 (2009). 10.1088/0957-4484/20/37/372001
-
(2009)
Nanotechnology
, vol.20
, pp. 372001
-
-
Botman, A.1
Mulders, J.J.L.2
Hagen, C.W.3
-
34
-
-
70349084635
-
-
JPAPBE 0022-3727, 10.1088/0022-3727/42/12/125305
-
V. Friedli and I. Utke, J. Phys. D JPAPBE 0022-3727 42, 125305 (2009). 10.1088/0022-3727/42/12/125305
-
(2009)
J. Phys. D
, vol.42
, pp. 125305
-
-
Friedli, V.1
Utke, I.2
-
35
-
-
33748268727
-
Measurement and simulation of impinging precursor molecule distribution in focused particle beam deposition/etch systems
-
DOI 10.1016/j.mee.2006.01.136, PII S0167931706001419
-
I. Utke, V. Friedli, S. Amorosi, J. Michler, and P. Hoffmann, Microelectron. Eng. MIENEF 0167-9317 83, 1499 (2006). 10.1016/j.mee.2006.01.136 (Pubitemid 44316479)
-
(2006)
Microelectronic Engineering
, vol.83
, Issue.4-9 SPEC. ISS.
, pp. 1499-1502
-
-
Utke, I.1
Friedli, V.2
Amorosi, S.3
Michler, J.4
Hoffmann, P.5
-
36
-
-
33847092951
-
Imaging deep trap distributions by low vacuum scanning electron microscopy
-
DOI 10.1063/1.2644159
-
M. Toth, W. R. Knowles, and M. R. Phillips, Appl. Phys. Lett. APPLAB 0003-6951 90, 072905 (2007). 10.1063/1.2644159 (Pubitemid 46280709)
-
(2007)
Applied Physics Letters
, vol.90
, Issue.7
, pp. 072905
-
-
Toth, M.1
Knowles, W.R.2
Phillips, M.R.3
-
37
-
-
13444273610
-
Reducing focused ion beam damage to transmission electron microscopy samples
-
DOI 10.1093/jmicro/dfh080, Focused Ion Beam
-
N. I. Kato, J. Electron Microsc. JELJA7 0022-0744 53, 451 (2004). 10.1093/jmicro/dfh080 (Pubitemid 40205590)
-
(2004)
Journal of Electron Microscopy
, vol.53
, Issue.5
, pp. 451-458
-
-
Kato, N.I.1
-
38
-
-
0036118711
-
Comparative evaluation of protective coatings and focused ion beam chemical vapor deposition processes
-
DOI 10.1116/1.1445165
-
B. W. Kempshall, L. A. Giannuzzi, B. I. Prenitzer, F. A. Stevie, and S. X. Da, J. Vac. Sci. Technol. B JVTBD9 1071-1023 20, 286 (2002). 10.1116/1.1445165 (Pubitemid 34221425)
-
(2002)
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
, vol.20
, Issue.1
, pp. 286-290
-
-
Kempshall, B.W.1
Giannuzzi, L.A.2
Prenitzer, B.I.3
Stevie, F.A.4
Da, S.X.5
-
41
-
-
0031400062
-
-
SCNNDF 0161-0457
-
P. Hovington, D. Drouin, R. Gauvin, D. C. Joy, and N. Evans, Scanning SCNNDF 0161-0457 19, 29 (1997).
-
(1997)
Scanning
, vol.19
, pp. 29
-
-
Hovington, P.1
Drouin, D.2
Gauvin, R.3
Joy, D.C.4
Evans, N.5
-
42
-
-
0000212732
-
-
JAPIAU 0021-8979, 10.1063/1.346400
-
Z. Czyewski, D. O. N. MacCallum, A. Romig, and D. C. Joy, J. Appl. Phys. JAPIAU 0021-8979 68, 3066 (1990). 10.1063/1.346400
-
(1990)
J. Appl. Phys.
, vol.68
, pp. 3066
-
-
Czyewski, Z.1
MacCallum, D.O.N.2
Romig, A.3
Joy, D.C.4
-
43
-
-
84984051858
-
-
SCNNDF 0161-0457
-
D. C. Joy and S. Luo, Scanning SCNNDF 0161-0457 11, 176 (1989).
-
(1989)
Scanning
, vol.11
, pp. 176
-
-
Joy, D.C.1
Luo, S.2
-
44
-
-
3242664527
-
-
APPLAB 0003-6951, 10.1063/1.1765736
-
V. Gopal, E. A. Stach, V. R. Radmilovic, and I. A. Mowat, Appl. Phys. Lett. APPLAB 0003-6951 85, 49 (2004). 10.1063/1.1765736
-
(2004)
Appl. Phys. Lett.
, vol.85
, pp. 49
-
-
Gopal, V.1
Stach, E.A.2
Radmilovic, V.R.3
Mowat, I.A.4
-
45
-
-
27744484845
-
Spatial resolution limits in electron-beam-induced deposition
-
DOI 10.1063/1.2085307, 084905
-
N. Silvis-Cividjian, C. W. Hagen, and P. Kruit, J. Appl. Phys. JAPIAU 0021-8979 98, 084905 (2005). 10.1063/1.2085307 (Pubitemid 41613624)
-
(2005)
Journal of Applied Physics
, vol.98
, Issue.8
, pp. 1-12
-
-
Silvis-Cividjian, N.1
Hagen, C.W.2
Kruit, P.3
-
46
-
-
34250175820
-
A nanoscale three-dimensional Monte Carlo simulation of electron-beam-induced deposition with gas dynamics
-
DOI 10.1088/0957-4484/18/26/265308, PII S0957448407443148
-
D. A. Smith, J. D. Fowlkes, and P. D. Rack, Nanotechnology NNOTER 0957-4484 18, 265308 (2007). 10.1088/0957-4484/18/26/265308 (Pubitemid 46905267)
-
(2007)
Nanotechnology
, vol.18
, Issue.26
, pp. 265308
-
-
Smith, D.A.1
Fowlkes, J.D.2
Rack, P.D.3
-
47
-
-
33947323734
-
Electron flux controlled switching between electron beam induced etching and deposition
-
DOI 10.1063/1.2437667
-
M. Toth, C. J. Lobo, G. Hartigan, and W. R. Knowles, J. Appl. Phys. JAPIAU 0021-8979 101, 054309 (2007). 10.1063/1.2437667 (Pubitemid 46440018)
-
(2007)
Journal of Applied Physics
, vol.101
, Issue.5
, pp. 054309
-
-
Toth, M.1
Lobo, C.J.2
Hartigan, G.3
Ralph Knowles, W.4
-
48
-
-
0003495856
-
-
Joint Committee on Powder Diffraction Standards (JCPDS). International Centre for Diffraction Data, File Number 4-802
-
Joint Committee on Powder Diffraction Standards (JCPDS). International Centre for Diffraction Data. Powder Diffraction File, File Number 4-802 (1998).
-
(1998)
Powder Diffraction File
-
-
-
50
-
-
0011086113
-
-
JPAPBE 0022-3727, 10.1088/0022-3727/5/1/308
-
K. Kanaya and S. Okayama, J. Phys. D JPAPBE 0022-3727 5, 43 (1972). 10.1088/0022-3727/5/1/308
-
(1972)
J. Phys. D
, vol.5
, pp. 43
-
-
Kanaya, K.1
Okayama, S.2
-
51
-
-
0001097135
-
-
JESRAW 0368-2048, 10.1016/S0368-2048(99)00068-7
-
J. Cazaux, J. Electron Spectrosc. Relat. Phenom. JESRAW 0368-2048 105, 155 (1999). 10.1016/S0368-2048(99)00068-7
-
(1999)
J. Electron Spectrosc. Relat. Phenom.
, vol.105
, pp. 155
-
-
Cazaux, J.1
-
52
-
-
35949005313
-
-
PRBMDO 0163-1829, 10.1103/PhysRevB.52.3122
-
M. A. S. Kalceff and M. R. Phillips, Phys. Rev. B PRBMDO 0163-1829 52, 3122 (1995). 10.1103/PhysRevB.52.3122
-
(1995)
Phys. Rev. B
, vol.52
, pp. 3122
-
-
Kalceff, M.A.S.1
Phillips, M.R.2
|