Characterizing state devices for switching noise

Conference Proceedings - IEEE SOUTHEASTCON

Volumn , Issue , 1997, Pages 276-277

  Hodson, Robert F ^a   Bampton, Anna E H ^a   Knipp, Peter A ^a  

^a CHRISTOPHER NEWPORT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; FLIP FLOP CIRCUITS; SPURIOUS SIGNAL NOISE; SWITCHING;

EDGE TRIGGERED DEVICES; LEVEL SENSITIVE DEVICES; SWITCHING NOISE;

APPLICATION SPECIFIC INTEGRATED CIRCUITS;

EID: 0030689354     PISSN: 07347502     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)