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Volumn , Issue , 2006, Pages 33-36

A method to measure impedance of chip/package/board power supply system using pseudo-impulse current

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED (CO); DIGITAL SYSTEMS; ELECTRICAL PERFORMANCES; ELECTRONIC PACKAGING; IMPULSE CURRENTS; POWER SUPPLY SYSTEMS; POWERPC; SYNCHRONOUS CLOCKING;

EID: 47949087109     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPEP.2006.321183     Document Type: Conference Paper
Times cited : (7)

References (5)
  • 1
    • 25344476663 scopus 로고    scopus 로고
    • Probes and Setup for Measuring Power-Plane Impedances with Vector Network Analyzer
    • I. Novak, "Probes and Setup for Measuring Power-Plane Impedances with Vector Network Analyzer," DesignCon 1999, pp.201-215, 1999.
    • (1999) DesignCon 1999 , pp. 201-215
    • Novak, I.1
  • 2
    • 2442422082 scopus 로고    scopus 로고
    • I. Kantorovich, C. Houghton, S. Root, and J. Laurent, Measurement of Low Impedance on Chip Power Supply Loop, IEEE Trans, on Adv. Packaging, 27, pp.10-14, 2004
    • I. Kantorovich, C. Houghton, S. Root, and J. Laurent, "Measurement of Low Impedance on Chip Power Supply Loop", IEEE Trans, on Adv. Packaging, 27, pp.10-14, 2004
  • 3
    • 15944377615 scopus 로고    scopus 로고
    • Measurement of Milliohms of impedance at Hundred MHz on Chip Power Supply Loop
    • th EPEP Topical Meeting, pp. 319-322, 2002.
    • (2002) th EPEP Topical Meeting , pp. 319-322
  • 4
    • 84945298990 scopus 로고    scopus 로고
    • CPU power supply impedance profile measurement using FFT and clock gating
    • A. Waizman, "CPU power supply impedance profile measurement using FFT and clock gating," IEEE 12th EPEP Topical Meeting, pp. 29-32, 2003.
    • (2003) IEEE 12th EPEP Topical Meeting , pp. 29-32
    • Waizman, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.