Wavelet based nonparametric regression approach for de-noising and modeling of transient switching noise measurements

Proceedings of 5th Electronics Packaging Technology Conference, EPTC 2003

Volumn , Issue , 2003, Pages 39-44

  Mandrekar, R ^a   Swaminathan, M ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA HANDLING; ELECTRONICS PACKAGING; FREQUENCY DOMAIN ANALYSIS; WAVELET ANALYSIS;

DIFFERENT FREQUENCY; FREQUENCY DOMAIN MEASUREMENT; HIGH PERFORMANCE SYSTEMS; MEASUREMENT-BASED APPROACH; NON-PARAMETRIC REGRESSION; SIGNAL MEASUREMENT; SIMULTANEOUS SWITCHING NOISE; TIME DOMAIN MEASUREMENT;

SWITCHING;

EID: 76549135437     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPTC.2003.1271487     Document Type: Conference Paper

References (7)

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7. th Topical meeting on Electrical Performance of Electronic Packaging, Oct 2003.