The Avogadro constant determination via enriched silicon-28

Measurement Science and Technology

Volumn 20, Issue 9, 2009, Pages

  Becker, P ^a   Friedrich, H ^a   Fujii, K ^b   Giardini, W ^c   Mana, G ^d   Picard, A ^e   Pohl, H J ^f   Riemann, H ^g   Valkiers, S ^h  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c NATIONAL MEASUREMENT INSTITUTE   (Australia)

^d ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

^e PAVILLON DE BRETEUIL   (France)

^f VITCON Projectconsult GmbH   (Germany)

^g LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

^h JOINT RESEARCH CENTRE   (Italy)

Author keywords

Avogadro constant determination; Crystal characterization; Density measurements; Enriched silicon 28; Fundamental physical constants; Kilogram redefinition; Lattice parameter measurements; Mass measurements; Molar mass measurements; Volume measurements; X ray

Indexed keywords

DENSITY MEASUREMENT (SPECIFIC GRAVITY); INTERNATIONAL COOPERATION; LATTICE CONSTANTS; SILICON; SILICON WAFERS; SINGLE CRYSTALS; X RAYS;

AVOGADRO CONSTANT; ENRICHED SILICON-28; FUNDAMENTAL PHYSICAL CONSTANT; KILOGRAM REDEFINITION; LATTICE PARAMETER MEASUREMENT; MASS MEASUREMENTS; MOLAR-MASS MEASUREMENTS;

VOLUME MEASUREMENT;

EID: 70350683735     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/20/9/092002     Document Type: Article

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