Determination of the Avogadro constant via the silicon route

Metrologia

Volumn 40, Issue 5, 2003, Pages 271-287

  Becker, P ^a   Bettin, H ^a   Danzebrink, H U ^a   Glaser M ^a   Kuetgens, U ^a   Nicolaus, A ^a   Schiel, D ^a   De Bievre P ^b   Valkiers, S ^b   Taylor, P ^b  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b JOINT RESEARCH CENTRE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (SPECIFIC GRAVITY); LATTICE CONSTANTS; SILICON; SINGLE CRYSTALS; X RAY ANALYSIS;

AVOGADRO CONSTANT; MOLAR MASS; X RAY CRYSTAL DENSITY MOLAR MASS METHOD;

MEASUREMENT THEORY;

EID: 0242336361     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/40/5/010     Document Type: Article

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