Present state of the Avogadro constant determination from silicon crystals with natural isotopic compositions

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 2, 2005, Pages 854-859

  Fujii, Kenichi ^a   Waseda, Atsushi ^a   Kuramoto, Naoki ^a   Mizushima, Shigeki ^a   Becker, Peter ^b   Bettin, Horst ^b   Nicolaus, Arnold ^b   Kuetgens, Ulrich ^b   Valkiers, Staf ^c   Taylor, Philip ^c   De Bièvre, Paul ^d   Mana, Giovanni ^e   Massa, Enrico ^e   Matyi, Richard ^f   Kessler Jr , Ernest G ^f   Hanke, Michael ^f  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c JOINT RESEARCH CENTRE   (Italy)

^d Metrology in Chemistry   (Belgium)

^e Istituto di Metrologia Gustavo Colonnetti   (Italy)

^f NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Avogadro constant; Density; Fundamental physical constant; Lattice constant; Molar mass; Molar volume; Silicon crystal

Indexed keywords

IMPURITIES; INTERFEROMETERS; LATTICE CONSTANTS; MASS SPECTROMETERS; MATRIX ALGEBRA; SILICON; SINGLE CRYSTALS;

AVOGADRO CONSTANT; FUNDAMENTAL PHYSICAL CONSTANT; MOLAR MASS; MOLAR VOLUME; SILICON CRYSTALS;

DENSITY MEASUREMENT (SPECIFIC GRAVITY);

EID: 20244374268     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.843101     Document Type: Article

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