Observation of low-temperature elastic softening due to vacancy in crystalline silicon

Journal of the Physical Society of Japan

Volumn 75, Issue 4, 2006, Pages

  Goto, Terutaka ^a   Yamada Kaneta, Hiroshi ^b   Saito, Yasuhiro ^a   Nemoto, Yuichi ^a   Sato, Koji ^a   Kakimoto, Koichi ^c   Nakamura, Shintaro ^d  

^a NIIGATA UNIVERSITY   (Japan)

^b FUJITSU LABORATORIES LTD   (Japan)

^c KYUSHU UNIVERSITY   (Japan)

^d TOHOKU UNIVERSITY   (Japan)

Author keywords

Crystalline silicon; Elastic softening; Jahn teller effect; Quadrupole susceptibility; Ultrasound; Vacancy

Indexed keywords

EID: 33645704192     PISSN: 00319015     EISSN: 00319015     Source Type: Journal    
DOI: 10.1143/JPSJ.75.044602     Document Type: Article

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