Precision determination of the density of a single crystal silicon sphere and evaluation of the Avogadro constant

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 2, 2001, Pages 587-592

  Kenny, Michael J ^a   Leistner, Achim J ^a   Walsh, Christopher J ^a   Fen, Kitty ^a   Giardini, Walter J ^a   Wielunski, Leszek S ^a   Netterfield, Roger P ^a   Ward, Bradley R ^a  

^a CSIRO   (Australia)

Author keywords

Avogadro constant; Buoyancy; Density; Mass measurement; Optical interferometry; Single crystal silicon

Indexed keywords

BUOYANCY; CRYSTAL STRUCTURE; DENSITY MEASUREMENT (SPECIFIC GRAVITY); ELLIPSOMETRY; INTERFEROMETRY; LATTICE CONSTANTS; OXIDES; SINGLE CRYSTALS; STAINLESS STEEL; SURFACE STRUCTURE; THERMAL EFFECTS; THICKNESS MEASUREMENT;

AVOGADRO CONSTANT; CRYSTAL QUALITY; MOLAR MASS; PRECISION DETERMINATION; SINGLE CRYSTAL SILICON SPHERE;

SILICON;

EID: 0035308943     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.918198     Document Type: Article

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