On the effect of broadband emission in external-cavity diode-laser interferometry

Measurement Science and Technology

Volumn 18, Issue 5, 2007, Pages 1338-1342

  Galzerano, Gianluca ^a   Mana, Giovanni ^b   Massa, Enrico ^b  

^a POLITECNICO DI MILANO   (Italy)

^b ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

Author keywords

Interferometry; Metrological applications of diode lasers; Parasitic modes

Indexed keywords

INTERFEROMETRY; LATTICE CONSTANTS; MEASUREMENT ERRORS; MOIRE FRINGES;

BROADBAND EMISSION; PARASITIC MODES;

SEMICONDUCTOR LASERS;

INTERFEROMETRY; LATTICE CONSTANTS; MEASUREMENT ERRORS; MOIRE FRINGES; SEMICONDUCTOR LASERS;

EID: 34247177599     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/18/5/020     Document Type: Article

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