A possible solution for the discrepancy between the INRIM and NMIJ values of the Si lattice-parameter

IEEE Transactions on Instrumentation and Measurement

Volumn 56, Issue 2, 2007, Pages 351-355

  Fujimoto, Hiroyuki ^a   Mana, Giovanni ^b   Nakayama, Kan ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

Author keywords

Fundamental constants; Laser interferometry; Silicon lattice parameter

Indexed keywords

DIFFRACTION; LASER BEAMS; LATTICE CONSTANTS; SEMICONDUCTING SILICON;

FUNDAMENTAL CONSTANTS; INTERFERING BEAMS; SILICON LATTICE-PARAMETER;

LASER INTERFEROMETRY;

EID: 34047193144     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.890778     Document Type: Conference Paper

References (8)

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