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Volumn 54, Issue 2, 2005, Pages 882-885
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Density measurement of a thin-film by the pressure-of-flotation method
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Author keywords
Avogadro constant; Density; Pressure of flotation method (PFM); Silicon crystal; Thickness; Thin film
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Indexed keywords
LATTICE CONSTANTS;
MOLYBDENUM;
SILICON;
SINGLE CRYSTALS;
SPUTTERING;
SUBSTRATES;
TEMPERATURE CONTROL;
THICKNESS MEASUREMENT;
THIN FILMS;
AVOGADRO CONSTANT;
PRESSURE-OF-FLOTATION (PFM) METHOD;
SILICON CRYSTAL;
DENSITY MEASUREMENT (SPECIFIC GRAVITY);
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EID: 17444382703
PISSN: 00189456
EISSN: None
Source Type: Journal
DOI: 10.1109/TIM.2005.843523 Document Type: Article |
Times cited : (12)
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References (6)
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