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Volumn 54, Issue 2, 2005, Pages 882-885

Density measurement of a thin-film by the pressure-of-flotation method

Author keywords

Avogadro constant; Density; Pressure of flotation method (PFM); Silicon crystal; Thickness; Thin film

Indexed keywords

LATTICE CONSTANTS; MOLYBDENUM; SILICON; SINGLE CRYSTALS; SPUTTERING; SUBSTRATES; TEMPERATURE CONTROL; THICKNESS MEASUREMENT; THIN FILMS;

EID: 17444382703     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.843523     Document Type: Article
Times cited : (12)

References (6)
  • 1
    • 0033333694 scopus 로고    scopus 로고
    • "Determination of the Avogadro constant by accurate measurement of the molar volume of a silicon crystal"
    • K. Fujii, M. Tanaka, Y. Nezu, K. Nakayama, H. Fujimoto, P. De Bièvre, and S. Valkiers, "Determination of the Avogadro constant by accurate measurement of the molar volume of a silicon crystal," Metrologia vol. 36, pp. 455-464, 1999.
    • (1999) Metrologia , vol.36 , pp. 455-464
    • Fujii, K.1    Tanaka, M.2    Nezu, Y.3    Nakayama, K.4    Fujimoto, H.5    De Bièvre, P.6    Valkiers, S.7
  • 3
    • 0026871448 scopus 로고
    • "Determination of differences in the density of silicon single crystals by observing their flotation at different pressures"
    • Jun
    • A. F. Kozdon and F. Spieweck, "Determination of differences in the density of silicon single crystals by observing their flotation at different pressures," IEEE Trans. Instrum. Meas, vol. 41, no. 3, pp. 420-426, Jun. 1992.
    • (1992) IEEE Trans. Instrum. Meas , vol.41 , Issue.3 , pp. 420-426
    • Kozdon, A.F.1    Spieweck, F.2
  • 4
    • 0035306916 scopus 로고    scopus 로고
    • "Density comparison measurement of silicon by pressure of flotation method"
    • Apr
    • A. Waseda and K. Fujii, "Density comparison measurement of silicon by pressure of flotation method," IEEE Trans. Instrum. Meas, vol. 50, no. 2, pp. 604-607, Apr. 2001.
    • (2001) IEEE Trans. Instrum. Meas , vol.50 , Issue.2 , pp. 604-607
    • Waseda, A.1    Fujii, K.2
  • 5
    • 0035654351 scopus 로고    scopus 로고
    • "High precision density comparison measurement of silicon crystals by the pressure of flotation method"
    • A. Waseda and K. Fujii, "High precision density comparison measurement of silicon crystals by the pressure of flotation method," Meas. Sci. Tech., vol. 12, pp. 2039-2045, 2001.
    • (2001) Meas. Sci. Tech. , vol.12 , pp. 2039-2045
    • Waseda, A.1    Fujii, K.2
  • 6
    • 2342475790 scopus 로고    scopus 로고
    • "Density comparison measurements of silicon crystals by a pressure-of-flotation method at NMIJ"
    • A. Waseda and K. Fujii, "Density comparison measurements of silicon crystals by a pressure-of-flotation method at NMIJ," Metrologia, vol. 41, pp. S62-S67, 2004.
    • (2004) Metrologia , vol.41
    • Waseda, A.1    Fujii, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.