Evaluation of the molar volume of silicon crystals for a determination of the Avogadro constant

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 2, 2003, Pages 646-651

  Fujii, Kenichi ^a   Waseda, Atsushi ^a   Kuramoto, Naoki ^a   Mizushima, Shigeki ^a   Tanaka, Mitsuru ^a   Valkiers, Staf ^b   Taylor, Philip ^b   Kessel, Rüdiger ^b   De Bièvre, Paul ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b JOINT RESEARCH CENTRE   (Italy)

Author keywords

Avogadro constant; Density; Lattice constant; Molar mass; Molar volume; Silicon crystal

Indexed keywords

CRYSTALS; DENSITY MEASUREMENT (SPECIFIC GRAVITY); LATTICE CONSTANTS; SILICON; X RAYS;

AVOGADRO CONSTANT; MOLAR VOLUME; SILICON CRYSTALS; X RAY CRYSTAL DENSITY METHOD;

VOLUME MEASUREMENT;

EID: 0038575693     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.810018     Document Type: Article

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