Scanning X-ray interferometry and the silicon lattice parameter: Towards 10-9 relative uncertainty?

European Physical Journal B

Volumn 9, Issue 2, 1999, Pages 225-232

  Bergamin, A ^a   Cavagnero, G ^a   Mana, G ^a   Zosi, G ^b  

^a Istituto di Metrologia Gustavo Colonnetti   (Italy)

^b UNIVERSITY OF TURIN   (Italy)

Author keywords

06.20.Jr Determination of fundamental constants; 06.30.Bp Spatial dimensions (e.g.. position, lengths, volume, angles, displacements, including nanometer scale displacements); 61.10. i X ray diffraction and scattering

Indexed keywords

EID: 0000688260     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1007/s100510050760     Document Type: Article

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