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Volumn 80, Issue 12, 2009, Pages

Atomic scale high-angle annular dark field STEM analysis of the N configuration in dilute nitrides of GaAs

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EID: 70350646937     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.125211     Document Type: Article
Times cited : (20)

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