Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs

Ultramicroscopy

Volumn 107, Issue 4-5, 2007, Pages 281-292

  Du, K ^a   von Hochmeister, K ^a   Phillipp, F ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

High resolution transmission electron microscopy; Image simulation

Indexed keywords

COMPUTER SIMULATION; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; SILICON; VIBRATION CONTROL;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE CONTRAST; IMAGE SIMULATION; ZERO LOSS ENERGY FILTERED IMAGES;

TRANSMISSION ELECTRON MICROSCOPY;

SILICON;

ARTICLE; CONTRAST ENHANCEMENT; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; IMAGE INTENSIFIER; SIMULATION; THICKNESS; TISSUE SECTION; TRANSMISSION ELECTRON MICROSCOPY; VIBRATION;

EID: 33846347545     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.08.003     Document Type: Article

References (35)

1. Van Landuyt J., Van Tendeloo G., and Amelinckx S. In: Heydenreich J., and Neumann W. (Eds). High-Resolution Electron Microscopy-Fundamentals and Application (1991), Halle/Saale 254
2. Mayer J., Gutekunst G., Möbus G., Dura J., Flynn C.P., and Rühle M. Acta Metall. Mater. 40 (1992) S217
3. Möbus G., and Rühle M. Ultramicroscopy 56 (1994) 54
4. Buckett M.I., and Merkle K.L. Ultramicroscopy 56 (1994) 71
5. King W.E., and Campbell G.H. Ultramicroscopy 56 (1994) 46
6. Schweinfest R., Ernst F., Wagner T., and Rühle M. J. Microsc. 194 (1999) 142
7. Hÿtch M.J., and Stobbs W.M. Ultramicroscopy 53 (1994) 191
8. Boothroyd C.B. J. Microsc. 190 (1998) 99
9. Möbus G., Phillipp F., Gemming T., Schweinfest R., and Rühle M. J. Electron Microsc. 46 (1997) 381
10. Stadelmann P.A. Ultramicroscopy 21 (1987) 131
11. Weickenmeier A., and Kohl H. Acta Crystallogr. Sect. A 47 (1991) 590
12. Peng L.-M., Ren G., Dudarev S.L., and Whelan M.J. Acta Crystallogr. Sect. A 52 (1996) 456
13. Meyer R.R., and Kirkland A.I. Microsc. Res. Tech. 49 (2000) 269
14. Weickenmeier A.L., Nüchter W., and Mayer J. Optik 99 (1995) 147
15. C. Hülk, I. Daberkow, in: Proceedings of the 14th International Congress on Electron Microscopy, vol. 1, Cancun, 1998, p. 189.
16. Press W.H., Teukolsky S.A., Vetterling W.T., and Flannery B.P. Numerical Recipes in FORTRAN (1992), Cambridge University Press, Cambridge
17. Smith D.J. Rep. Prog. Phys. 60 (1997) 1513
18. Frank J. In: Hawkes P.W. (Ed). Computer Processing of Electron Microscope Images (1980), Springer, Berlin 187
19. Möbus G., Schweinfest R., Gemming T., Wagner T., and Rühle M. J. Microsc. 190 (1998) 109
20. K. Scheerschmidt, unpublished.
21. O'Keefe M.A., and Sanders J.V. Acta Crystallogr. Sect A 31 (1975) 307
22. Lenz F.A. In: Valdre U. (Ed). Electron Microscopy in Materials Science (1971), Academic Press, London 541
23. Meyer R.R., and Kirkland A.I. Ultramicroscopy 75 (1998) 23
24. Qu W., Boothroyd C., and Huan A. Appl. Surf. Sci. 252 (2006) 3984
25. T. Gemming, Quantitative Untersuchung von Werkstoffstrukturen bei atomarer Ortsauflösung, Dissertation, Universität Stuttgart, 1998.
26. R. Höschen, W. Sigle, F. Phillipp, in: Proceedings of the 11th European Congress on Electron Microscopy, Dublin, 1996, CD-ROM, T13.
27. Stobbs W.M., and Saxton W.O. J. Microsc. 151 (1988) 171
28. von Hochmeister K., and Phillipp F. Optik 74 Suppl. 7 (1997) 21
29. Möbus G., Gemming T., and Gumbsch P. Acta Crystallogr. Sect. A 54 (1998) 83
30. Lehmann M., and Lichte H. Microsc. Microanal. 9 Suppl. 3 (2003) 46
31. Van Dyck D., Lichte H., and Spence J.C.H. Ultramicroscopy 81 (2000) 187
32. Howie A. Ultramicroscopy 98 (2004) 73
33. Lichte H. Ultramicroscopy 20 (1988) 293
34. P.E. Mooney, D.N. Bui, O.L. Krivanek, in: Proceedings of the 13th International Congress on Electron Microscopy, vol.1, Paris, 1994, p. 213.
35. Gubbens A.J., Kraus B., Krivanek O.L., and Mooney P.E. Ultramicroscopy 59 (1995) 255